Membership
Tour
Register
Log in
Toru KURENUMA
Follow
Person
Ibaraki, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Scanning probe microscope
Patent number
8,844,061
Issue date
Sep 23, 2014
Hitachi, Ltd.
Shuichi Baba
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope
Patent number
8,342,008
Issue date
Jan 1, 2013
Hitachi, Ltd.
Shuichi Baba
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope
Patent number
8,011,230
Issue date
Sep 6, 2011
Hitachi, Ltd.
Masahiro Watanabe
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope
Patent number
7,631,548
Issue date
Dec 15, 2009
Hitachi, Ltd.
Shuichi Baba
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope
Patent number
7,498,589
Issue date
Mar 3, 2009
Hitachi Kenki Fine Tech Co., Ltd.
Shigenobu Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Automatically operated shovel and stone crushing system comprising...
Patent number
6,732,458
Issue date
May 11, 2004
Hitachi Construction Machinery Co., Ltd.
Toru Kurenuma
E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information
Patent Grant
Automatically operated shovel and stone crushing system comprising...
Patent number
6,523,765
Issue date
Feb 25, 2003
Hitachi Construction Machinery Co., Ltd.
Toru Kurenuma
E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information
Patent Grant
Emergency shutdown system for controlling industrial robot
Patent number
5,363,474
Issue date
Nov 8, 1994
Hitachi Construction Machinery Co., Ltd.
Shinichi Sarugaku
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Position/force controlling apparatus for working machine with multi...
Patent number
5,129,044
Issue date
Jul 7, 1992
Hitachi Construction Machinery Co., Ltd.
Kunio Kashiwagi
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Patents Applications
last 30 patents
Information
Patent Application
SCANNING PROBE MICROSCOPE
Publication number
20140298548
Publication date
Oct 2, 2014
Shuichi BABA
B82 - NANO-TECHNOLOGY
Information
Patent Application
SCANNING PROBE MICROSCOPE
Publication number
20130205454
Publication date
Aug 8, 2013
Hitachi, Ltd
Shuichi BABA
B82 - NANO-TECHNOLOGY
Information
Patent Application
Scanning Probe Microscope
Publication number
20090158828
Publication date
Jun 25, 2009
Shuichi BABA
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAME
Publication number
20080245139
Publication date
Oct 9, 2008
Takafumi Morimoto
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE
Publication number
20080223122
Publication date
Sep 18, 2008
Masahiro Watanabe
G01 - MEASURING TESTING
Information
Patent Application
PROBE CONTROL METHOD FOR SCANNING PROBE MICROSCOPE
Publication number
20080087820
Publication date
Apr 17, 2008
Toru KURENUMA
G01 - MEASURING TESTING
Information
Patent Application
Scanning Probe Microscope
Publication number
20070266780
Publication date
Nov 22, 2007
SHUICHI BABA
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for determining surface profiles using a scann...
Publication number
20060097162
Publication date
May 11, 2006
Shigenobu Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Automatically operated shovel and stone crushing system comprising...
Publication number
20030019132
Publication date
Jan 30, 2003
HITACHI CONSTRUCTION MACHINERY CO., LTD.
Toru Kurenuma
E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING