Toru KURIHARA

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Kochi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system and inspection method
- Patent number 10,775,316
- Issue date Sep 15, 2020
- Ricoh Elemex Corporation
- Keiichi Akazawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 10,739,272
- Issue date Aug 11, 2020
- The University of Tokyo
- Toru Kurihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 10,724,960
- Issue date Jul 28, 2020
- The University of Tokyo
- Toru Kurihara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20200011810
- Publication date Jan 9, 2020
- RICOH ELEMEX CORPORATION
- Keiichi AKAZAWA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20170115230
- Publication date Apr 27, 2017
- Toru KURIHARA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20170108443
- Publication date Apr 20, 2017
- THE UNIVERSITY OF TOKYO
- Toru KURIHARA
- G01 - MEASURING TESTING