Toru Matsumoto

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ultrasonic testing device and ultrasonic testing method
- Patent number 12,209,996
- Issue date Jan 28, 2025
- National University Corporation Toyohashi University of Technology
- Naohiro Hozumi
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing device and ultrasonic testing method
- Patent number 12,153,021
- Issue date Nov 26, 2024
- National University Corporation Toyohashi University of Technology
- Naohiro Hozumi
- G01 - MEASURING TESTING
Information Patent Grant
Device analysis apparatus and device analysis method
- Patent number 11,460,497
- Issue date Oct 4, 2022
- Hamamatsu Photonics K.K.
- Toru Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic inspection device
- Patent number 11,428,673
- Issue date Aug 30, 2022
- Hamamatsu Photonics K.K.
- Toru Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting semiconductor device
- Patent number 11,156,565
- Issue date Oct 26, 2021
- Hamamatsu Photonics K.K.
- Toru Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting semiconductor device
- Patent number 11,125,698
- Issue date Sep 21, 2021
- Hamamatsu Photonics K.K.
- Toru Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ultrasonic inspection device and ultrasonic inspection method
- Patent number 11,105,777
- Issue date Aug 31, 2021
- Hamamatsu Photonics K.K.
- Toru Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection apparatus and semiconductor device...
- Patent number 10,955,458
- Issue date Mar 23, 2021
- Hamamatsu Photonics K.K.
- Toru Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave detection device
- Patent number 8,993,967
- Issue date Mar 31, 2015
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ULTRASONIC TESTING DEVICE AND ULTRASONIC TESTING METHOD
- Publication number 20220163485
- Publication date May 26, 2022
- National University Corporation Toyohashi University of Technology
- Naohiro HOZUMI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20200386693
- Publication date Dec 10, 2020
- Hamamatsu Photonics K.K.
- Toru MATSUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE ANALYSIS APPARATUS AND DEVICE ANALYSIS METHOD
- Publication number 20200110127
- Publication date Apr 9, 2020
- Hamamatsu Photonics K.K.
- Toru MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION DEVICE AND ULTRASONIC INSPECTION METHOD
- Publication number 20200057032
- Publication date Feb 20, 2020
- Hamamatsu Photonics K.K.
- Toru MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION APPARATUS AND SEMICONDUCTOR DEVICE...
- Publication number 20190271734
- Publication date Sep 5, 2019
- Hamamatsu Photonics K.K.
- Toru MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION DEVICE
- Publication number 20190257798
- Publication date Aug 22, 2019
- Hamamatsu Photonics K.K.
- Toru MATSUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROMAGNETIC WAVE DETECTION DEVICE
- Publication number 20120326041
- Publication date Dec 27, 2012
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20110216312
- Publication date Sep 8, 2011
- HAMAMATSU PHOTONICS K. K.
- Toru Matsumoto
- G01 - MEASURING TESTING

Toru Matsumoto

Person

Patents Grantslast 30 patents

Ultrasonic testing device and ultrasonic testing method

Ultrasonic testing device and ultrasonic testing method

Device analysis apparatus and device analysis method

Ultrasonic inspection device

Method for inspecting semiconductor device

Method for inspecting semiconductor device

Ultrasonic inspection device and ultrasonic inspection method

Semiconductor device inspection apparatus and semiconductor device...

Electromagnetic wave detection device

Patents Applicationslast 30 patents

ULTRASONIC TESTING DEVICE AND ULTRASONIC TESTING METHOD

METHOD FOR INSPECTING SEMICONDUCTOR DEVICE

DEVICE ANALYSIS APPARATUS AND DEVICE ANALYSIS METHOD

ULTRASONIC INSPECTION DEVICE AND ULTRASONIC INSPECTION METHOD

SEMICONDUCTOR DEVICE INSPECTION APPARATUS AND SEMICONDUCTOR DEVICE...

ULTRASONIC INSPECTION DEVICE

ELECTROMAGNETIC WAVE DETECTION DEVICE

SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD