Toru MITSUNAGA

Person

Hachioji-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Processing method, processing apparatus and processing program conf...
- Patent number 10,876,979
- Issue date Dec 29, 2020
- Rigaku Corporation
- Hisashi Konaka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis device and method for optical axis alignment thereof
- Patent number 10,837,923
- Issue date Nov 17, 2020
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction apparatus
- Patent number 10,732,134
- Issue date Aug 4, 2020
- Rigaku Corporation
- Takeshi Osakabe
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for measuring bowing of single-crystal substrate
- Patent number 10,444,168
- Issue date Oct 15, 2019
- Rigaku Corporation
- Katsuhiko Inaba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction apparatus and method of measuring X-ray diffraction
- Patent number 9,322,792
- Issue date Apr 26, 2016
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 9,218,315
- Issue date Dec 22, 2015
- Rigaku Corporation
- Toru Mitsunaga
- G01 - MEASURING TESTING
Information Patent Grant
X-ray intensity correction method and X-ray diffractometer
- Patent number 9,086,367
- Issue date Jul 21, 2015
- Rigaku Corporation
- Toru Mitsunaga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYSIS DEVICE AND METHOD FOR OPTICAL AXIS ALIGNMENT THEREOF
- Publication number 20200003708
- Publication date Jan 2, 2020
- Rigaku Corporation
- SHINTARO KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS
- Publication number 20190293575
- Publication date Sep 26, 2019
- Rigaku Corporation
- TAKESHI OSAKABE
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
PROCESSING METHOD, PROCESSING APPARATUS AND PROCESSING PROGRAM
- Publication number 20170370860
- Publication date Dec 28, 2017
- Rigaku Corporation
- Hisashi KONAKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND METHOD OF MEASURING X-RAY DIFFRACTION
- Publication number 20150146861
- Publication date May 28, 2015
- Rigaku Corporation
- Shintaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING BOWING OF SINGLE-CRYSTAL SUBSTRATE
- Publication number 20140379282
- Publication date Dec 25, 2014
- Rigaku Corporation
- Katsuhiko INABA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20130138382
- Publication date May 30, 2013
- Rigaku Corporation
- Toru Mitsunaga
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INTENSITY CORRECTION METHOD AND X-RAY DIFFRACTOMETER
- Publication number 20130121460
- Publication date May 16, 2013
- Rigaku Corporation
- Toru MITSUNAGA
- G01 - MEASURING TESTING

Toru MITSUNAGA

Person

Patents Grantslast 30 patents

Processing method, processing apparatus and processing program conf...

X-ray analysis device and method for optical axis alignment thereof

X-ray diffraction apparatus

Method and apparatus for measuring bowing of single-crystal substrate

X-ray diffraction apparatus and method of measuring X-ray diffraction

X-ray analysis apparatus

X-ray intensity correction method and X-ray diffractometer

Patents Applicationslast 30 patents

X-RAY ANALYSIS DEVICE AND METHOD FOR OPTICAL AXIS ALIGNMENT THEREOF

X-RAY DIFFRACTION APPARATUS

PROCESSING METHOD, PROCESSING APPARATUS AND PROCESSING PROGRAM

X-RAY DIFFRACTION APPARATUS AND METHOD OF MEASURING X-RAY DIFFRACTION

METHOD AND APPARATUS FOR MEASURING BOWING OF SINGLE-CRYSTAL SUBSTRATE

X-RAY ANALYSIS APPARATUS

X-RAY INTENSITY CORRECTION METHOD AND X-RAY DIFFRACTOMETER