Toru Otani

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Atsugi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing device comprising circuitry to calculate a correction value...
- Patent number 10,317,503
- Issue date Jun 11, 2019
- Anritsu Corporation
- Koji Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Signal analysis apparatus and signal analysis method
- Patent number 9,140,730
- Issue date Sep 22, 2015
- Anritsu Corporation
- Toru Otani
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer and spectrum analysis method
- Patent number 8,509,296
- Issue date Aug 13, 2013
- Anritsu Corporation
- Momoko Inadomaru
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING DEVICE AND ITS CALIBRATION METHOD
- Publication number 20160077158
- Publication date Mar 17, 2016
- Anritsu Corporation
- Koji Yamashita
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ANALYSIS APPARATUS AND SIGNAL ANALYSIS METHOD
- Publication number 20140294199
- Publication date Oct 2, 2014
- Anritsu Corporation
- Toru Otani
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM ANALYZER AND SPECTRUM ANALYSIS METHOD
- Publication number 20110150062
- Publication date Jun 23, 2011
- Anritsu Corporation
- Momoko Inadomaru
- G01 - MEASURING TESTING