Toru Shuto

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Naka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement or inspecting apparatus
- Patent number 8,921,781
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope, and specimen holding method
- Patent number 8,680,466
- Issue date Mar 25, 2014
- Hitachi High-Technologies Coporation
- Seiichiro Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspecting apparatus
- Patent number 8,519,332
- Issue date Aug 27, 2013
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspecting apparatus
- Patent number 8,232,522
- Issue date Jul 31, 2012
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INSPECTING APPARATUS
- Publication number 20130327939
- Publication date Dec 12, 2013
- Hitachi High-Technologies
- Go MIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTING APPARATUS
- Publication number 20120261589
- Publication date Oct 18, 2012
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE, AND SPECIMEN HOLDING METHOD
- Publication number 20110303844
- Publication date Dec 15, 2011
- Hitachi High-Technologies Corporation
- Seiichiro Kanno
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTING APPARATUS
- Publication number 20110095185
- Publication date Apr 28, 2011
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS