TREA

Toru YAKU

Follow

Person

  • Kawasaki-shi, JP
People

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    TELECENTRIC OPTICAL APPARATUS
    • Publication number 20200073093
    • Publication date Mar 5, 2020
    • Mitutoyo Corporation
    • Kenji Okabe
    • G02 - OPTICS
  • Information Patent Application

    DISPLACEMENT MEASUREMENT APPARATUS
    • Publication number 20190145800
    • Publication date May 16, 2019
    • Mitutoyo Corporation
    • Toru Yaku
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC ENCODER
    • Publication number 20170276522
    • Publication date Sep 28, 2017
    • Mitutoyo Corporation
    • Shu Hirata
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCODER
    • Publication number 20170067758
    • Publication date Mar 9, 2017
    • Mitutoyo Corporation
    • Toru Yaku
    • G01 - MEASURING TESTING
  • Information Patent Application

    TELECENTRIC OPTICAL APPARATUS
    • Publication number 20160349490
    • Publication date Dec 1, 2016
    • Mitutoyo Corporation
    • Kenji Okabe
    • G02 - OPTICS
  • Information Patent Application

    PHASE ADJUSTER AND ENCODER
    • Publication number 20160294364
    • Publication date Oct 6, 2016
    • MITUTOYO CORPORATION
    • Tetsuro KIRIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC ENCODER
    • Publication number 20150060653
    • Publication date Mar 5, 2015
    • Mitutoyo Corporation
    • Toru Yaku
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR PACKAGE AND METHOD FOR MANUFACTURING THE SAME
    • Publication number 20130181353
    • Publication date Jul 18, 2013
    • MITUTOYO CORPORATION
    • Toru YAKU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ORIGIN LOCATION DETECTION CIRCUIT
    • Publication number 20120085896
    • Publication date Apr 12, 2012
    • MITUTOYO CORPORATION
    • Ryuichi KOISO
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER
    • Publication number 20110233390
    • Publication date Sep 29, 2011
    • Mitutoyo Corporation
    • Tatsuya Nagahama
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL ENCODER
    • Publication number 20110233391
    • Publication date Sep 29, 2011
    • Mitutoyo Corporation
    • Eric Herbert Altendorf
    • G01 - MEASURING TESTING
  • Information Patent Application

    LENS ABERRATION CORRECTION IN A DOUBLY TELECENTRIC DISPLACEMENT SENSOR
    • Publication number 20110031383
    • Publication date Feb 10, 2011
    • Mitutoyo Corporation
    • Joseph D. Tobiason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Reflection Type Encoder, Scale Thereof and Method for Producing Scale
    • Publication number 20090316155
    • Publication date Dec 24, 2009
    • Mitutoyo Corporation
    • Toru Yaku
    • G01 - MEASURING TESTING
  • Information Patent Application

    REFLECTION TYPE ENCODER
    • Publication number 20090057406
    • Publication date Mar 5, 2009
    • Mitutoyo Corporation
    • Toru Yaku
    • G01 - MEASURING TESTING
  • Information Patent Application

    Optical encoder
    • Publication number 20080111063
    • Publication date May 15, 2008
    • Mitutoyo Corporation
    • Takanori OTSUKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Photoelectric encoder, scale and method of manufacturing scale
    • Publication number 20080099666
    • Publication date May 1, 2008
    • Mitutoyo Corporation
    • Norio MASADA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC ENCODER
    • Publication number 20070187583
    • Publication date Aug 16, 2007
    • Mitutoyo Corporation
    • Toru Yaku
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC ENCODER
    • Publication number 20070125939
    • Publication date Jun 7, 2007
    • Mitutoyo Corporation
    • Toru Yaku
    • G01 - MEASURING TESTING
  • Information Patent Application

    Photoelectric encoder
    • Publication number 20060097141
    • Publication date May 11, 2006
    • Mitutoyo Corporation
    • Tetsuro Kiriyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Optical encoder and method of fabricating its sensor head
    • Publication number 20020008195
    • Publication date Jan 24, 2002
    • Mitutoyo Corporation
    • Toshihiko Aoki
    • G01 - MEASURING TESTING