Toshiaki Fujii

Person

Chiba-si, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample processing evaluation apparatus
- Patent number 9,679,743
- Issue date Jun 13, 2017
- Hitachi High-Tech Science Corporation
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal analysis apparatus, composite charged particle beam device,...
- Patent number 9,470,642
- Issue date Oct 18, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Flight control system loading test apparatus and method
- Patent number 9,297,719
- Issue date Mar 29, 2016
- Honda Patents & Technologies North America, LLC
- Toshiaki Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Crystal analysis apparatus, composite charged particle beam device,...
- Patent number 9,046,472
- Issue date Jun 2, 2015
- Hitachi High-Tech Science Corporation
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Cross section processing method and method of manufacturing cross s...
- Patent number 8,703,247
- Issue date Apr 22, 2014
- SII NanoTechnology Inc.
- Hidekazu Suzuki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Electron microscope and specimen analyzing method
- Patent number 8,664,598
- Issue date Mar 4, 2014
- SII NanoTechnology Inc.
- Masakatsu Hasuda
- G01 - MEASURING TESTING
Information Patent Grant
Video encoding method and decoding method by using selected paralla...
- Patent number 8,548,064
- Issue date Oct 1, 2013
- Nippon Telegraph and Telephone Corporation
- Masaki Kitahara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Video encoding method and decoding method, apparatuses therefor, pr...
- Patent number 8,451,894
- Issue date May 28, 2013
- Nippon Telegraph and Telephone Corporation
- Masayuki Tanimoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Section processing method and its apparatus
- Patent number 8,306,264
- Issue date Nov 6, 2012
- SII NanoTechnology Inc.
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite focused ion beam device, process observation method using...
- Patent number 8,274,063
- Issue date Sep 25, 2012
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing and observing method
- Patent number 8,274,049
- Issue date Sep 25, 2012
- SII NanoTechnology Inc.
- Keiichi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite focused ion beam device, and processing observation metho...
- Patent number 8,269,194
- Issue date Sep 18, 2012
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for working and observing samples and method of working a...
- Patent number 7,755,044
- Issue date Jul 13, 2010
- Sii Nano Technology Inc.
- Toshiaki Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Nanobio device of imitative anatomy structure
- Patent number 7,736,893
- Issue date Jun 15, 2010
- SII NanoTechnology Inc.
- Masanao Munekane
- G01 - MEASURING TESTING
Information Patent Grant
Composite charged-particle beam system
- Patent number 7,718,981
- Issue date May 18, 2010
- SII NanoTechnology Inc.
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making lamina specimen
- Patent number 7,700,367
- Issue date Apr 20, 2010
- SII NanoTechnology Inc.
- Toshiaki Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus and sample section forming and thin-piec...
- Patent number 7,531,796
- Issue date May 12, 2009
- SII NanoTechnology Inc.
- Junichi Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Processing apparatus using focused charged particle beam
- Patent number 7,518,125
- Issue date Apr 14, 2009
- SII NanoTechnology Inc.
- Yo Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,442,942
- Issue date Oct 28, 2008
- SII NanoTechnology Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and method of forming electrodes ha...
- Patent number 7,301,159
- Issue date Nov 27, 2007
- Riken & SII NanoTechnology Inc.
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radio communication system and destination portable terminal time i...
- Patent number 7,298,729
- Issue date Nov 20, 2007
- NEC Corporation
- Toshiaki Fujii
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Ion beam device and ion beam processing method
- Patent number 7,276,691
- Issue date Oct 2, 2007
- SII NanoTechnology Inc.
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Grant
TEM sample equipped with an identifying function, focused ion beam...
- Patent number 7,095,024
- Issue date Aug 22, 2006
- SII NanoTechnology Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Network system for controlling independent access to stored data am...
- Patent number 7,020,152
- Issue date Mar 28, 2006
- SII NanoTechnology Inc.
- Toshio Doi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Specimen analyzing method
- Patent number 6,934,920
- Issue date Aug 23, 2005
- SII NanoTechnology Inc.
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for processing and observing a sample
- Patent number 6,870,161
- Issue date Mar 22, 2005
- SII NanoTechnology Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam apparatus, ion beam processing method and sample holder me...
- Patent number 6,838,685
- Issue date Jan 4, 2005
- SII NanoTechnology Inc.
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring film thickness
- Patent number 6,489,612
- Issue date Dec 3, 2002
- Seiko Instruments Inc.
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Grant
Sample transfer apparatus and sample stage
- Patent number 6,384,418
- Issue date May 7, 2002
- Seiko Instruments Inc.
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Section formation observing method
- Patent number 6,331,712
- Issue date Dec 18, 2001
- Seiko Instruments Inc.
- Yasuhiko Sugiyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE PROCESSING EVALUATION APPARATUS
- Publication number 20160247662
- Publication date Aug 25, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiaki FUJII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL ANALYSIS APPARATUS, COMPOSITE CHARGED PARTICLE BEAM DEVICE,...
- Publication number 20150226684
- Publication date Aug 13, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G01 - MEASURING TESTING
Information Patent Application
FLIGHT CONTROL SYSTEM LOADING TEST APPARATUS AND METHOD
- Publication number 20140318266
- Publication date Oct 30, 2014
- HONDA PATENTS & TECHNOLOGIES NORTH AMERICA, LLC
- Toshiaki Fujii
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL ANALYSIS APPARATUS, COMPOSITE CHARGED PARTICLE BEAM DEVICE,...
- Publication number 20140077097
- Publication date Mar 20, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G01 - MEASURING TESTING
Information Patent Application
Sample processing and observing method
- Publication number 20110226948
- Publication date Sep 22, 2011
- Keiichi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope and specimen analyzing method
- Publication number 20110186734
- Publication date Aug 4, 2011
- Masakatsu Hasuda
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE FOCUSED ION BEAM DEVICE, PROCESS OBSERVATION METHOD USING...
- Publication number 20100288924
- Publication date Nov 18, 2010
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
Video Encoding Method and Decoding Method, Apparatuses Therefor, Pr...
- Publication number 20100220784
- Publication date Sep 2, 2010
- IPPON TELEGRAPH AND TELEPHONE CORPORATION
- Masayuki Tanimoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CROSS SECTION PROCESSING METHOD AND METHOD OF MANUFACTURING CROSS S...
- Publication number 20100189917
- Publication date Jul 29, 2010
- Hidekazu Suzuki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
COMPOSITE FOCUSED ION BEAM DEVICE, AND PROCESSING OBSERVATION METHO...
- Publication number 20100176296
- Publication date Jul 15, 2010
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
Section processing method and its apparatus
- Publication number 20100008563
- Publication date Jan 14, 2010
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Video Encoding Method and Decoding Method, Apparatuses Therefor, Pr...
- Publication number 20090028248
- Publication date Jan 29, 2009
- Nippon Telegraph and Telephone Corporation
- Masaki Kitahara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COMPOSITE CHARGED-PARTICLE BEAM SYSTEM
- Publication number 20080315088
- Publication date Dec 25, 2008
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR WORKING AND OBSERVING SAMPLES AND METHOD OF WORKING A...
- Publication number 20080224198
- Publication date Sep 18, 2008
- Toshiaki Fujii
- G01 - MEASURING TESTING
Information Patent Application
FOCUSED ION BEAM APPARATUS AND SAMPLE SECTION FORMING AND THIN-PIEC...
- Publication number 20080042059
- Publication date Feb 21, 2008
- Junichi Tashiro
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20070045560
- Publication date Mar 1, 2007
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Processing apparatus using focused charged particle beam
- Publication number 20070040128
- Publication date Feb 22, 2007
- Yo Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Nanobio device of imitative anatomy structure
- Publication number 20060188946
- Publication date Aug 24, 2006
- Masanao Munekane
- G01 - MEASURING TESTING
Information Patent Application
Ion beam device and ion beam processing method
- Publication number 20060163497
- Publication date Jul 27, 2006
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Application
Thin piece specimen preparing method and composite charged particle...
- Publication number 20060157341
- Publication date Jul 20, 2006
- Toshiaki Fujii
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus and method of forming electrodes ha...
- Publication number 20060038137
- Publication date Feb 23, 2006
- Toshiaki Fujii
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Ion beam device and ion beam processing method, and holder member
- Publication number 20050236587
- Publication date Oct 27, 2005
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Application
TEM sample equipped with an identifying function, focused ion beam...
- Publication number 20040227082
- Publication date Nov 18, 2004
- Tatsuya Adachi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Electrochemical cell
- Publication number 20040209163
- Publication date Oct 21, 2004
- Shunji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for surface or cross-sectional processing and obs...
- Publication number 20040154744
- Publication date Aug 12, 2004
- Takashi Kaito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Sample manufacturing apparatus
- Publication number 20040129897
- Publication date Jul 8, 2004
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Application
Focused ion beam system and machining method using it
- Publication number 20030173527
- Publication date Sep 18, 2003
- Tatsuya Adachi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen analyzing method
- Publication number 20030145291
- Publication date Jul 31, 2003
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radio communication system and destination portable terminal time i...
- Publication number 20030117994
- Publication date Jun 26, 2003
- NEC Corporation
- Toshiaki Fujii
- G04 - HOROLOGY

Toshiaki Fujii

Person

Patents Grantslast 30 patents

Sample processing evaluation apparatus

Crystal analysis apparatus, composite charged particle beam device,...

Flight control system loading test apparatus and method

Crystal analysis apparatus, composite charged particle beam device,...

Cross section processing method and method of manufacturing cross s...

Electron microscope and specimen analyzing method

Video encoding method and decoding method by using selected paralla...

Video encoding method and decoding method, apparatuses therefor, pr...

Section processing method and its apparatus

Composite focused ion beam device, process observation method using...

Sample processing and observing method

Composite focused ion beam device, and processing observation metho...

Apparatus for working and observing samples and method of working a...

Nanobio device of imitative anatomy structure

Composite charged-particle beam system

Method of making lamina specimen

Focused ion beam apparatus and sample section forming and thin-piec...

Processing apparatus using focused charged particle beam

Charged particle beam apparatus

Charged particle beam apparatus and method of forming electrodes ha...

Radio communication system and destination portable terminal time i...

Ion beam device and ion beam processing method

TEM sample equipped with an identifying function, focused ion beam...

Network system for controlling independent access to stored data am...

Specimen analyzing method

Apparatus for processing and observing a sample

Ion beam apparatus, ion beam processing method and sample holder me...

Method of measuring film thickness

Sample transfer apparatus and sample stage

Section formation observing method

Patents Applicationslast 30 patents

SAMPLE PROCESSING EVALUATION APPARATUS

CRYSTAL ANALYSIS APPARATUS, COMPOSITE CHARGED PARTICLE BEAM DEVICE,...

FLIGHT CONTROL SYSTEM LOADING TEST APPARATUS AND METHOD

CRYSTAL ANALYSIS APPARATUS, COMPOSITE CHARGED PARTICLE BEAM DEVICE,...

Sample processing and observing method

Electron microscope and specimen analyzing method

COMPOSITE FOCUSED ION BEAM DEVICE, PROCESS OBSERVATION METHOD USING...

Video Encoding Method and Decoding Method, Apparatuses Therefor, Pr...

CROSS SECTION PROCESSING METHOD AND METHOD OF MANUFACTURING CROSS S...

COMPOSITE FOCUSED ION BEAM DEVICE, AND PROCESSING OBSERVATION METHO...

Section processing method and its apparatus

Video Encoding Method and Decoding Method, Apparatuses Therefor, Pr...

COMPOSITE CHARGED-PARTICLE BEAM SYSTEM

APPARATUS FOR WORKING AND OBSERVING SAMPLES AND METHOD OF WORKING A...

FOCUSED ION BEAM APPARATUS AND SAMPLE SECTION FORMING AND THIN-PIEC...

Charged particle beam apparatus

Processing apparatus using focused charged particle beam

Nanobio device of imitative anatomy structure

Ion beam device and ion beam processing method

Thin piece specimen preparing method and composite charged particle...

Charged particle beam apparatus and method of forming electrodes ha...

Ion beam device and ion beam processing method, and holder member

TEM sample equipped with an identifying function, focused ion beam...

Electrochemical cell

Method and system for surface or cross-sectional processing and obs...

Sample manufacturing apparatus

Focused ion beam system and machining method using it

Specimen analyzing method

Radio communication system and destination portable terminal time i...