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Toshiaki HAMANO

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Ultrasonic flaw detection device
    • Patent number 11,875,497
    • Issue date Jan 16, 2024
    • IHI Corporation
    • Toshiaki Hamano
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Inspection system
    • Patent number 10,801,996
    • Issue date Oct 13, 2020
    • IHI Corporation
    • Eisuke Shiina
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Inspection probe
    • Patent number 10,365,151
    • Issue date Jul 30, 2019
    • IHI Corporation
    • Toshiaki Hamano
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ULTRASONIC FLAW DETECTION DEVICE
    • Publication number 20220137002
    • Publication date May 5, 2022
    • IHI Corporation
    • Toshiaki HAMANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    ULTRASONIC FLAW DETECTION DEVICE
    • Publication number 20210390680
    • Publication date Dec 16, 2021
    • IHI Corporation
    • Toshiaki HAMANO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    INSPECTION PROBE
    • Publication number 20170219422
    • Publication date Aug 3, 2017
    • IHI Corporation
    • Toshiaki HAMANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION SYSTEM
    • Publication number 20160231284
    • Publication date Aug 11, 2016
    • IHI Corporation
    • Eisuke SHIINA
    • G01 - MEASURING TESTING