Toshiaki Ichinose

Follow

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection method for soldered joints using x-ray imaging and appar...
- Patent number 5,463,667
- Issue date Oct 31, 1995
- Hitachi, Ltd.
- Toshiaki Ichinose
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing thin film multilayer substrate, and method and...
- Patent number 5,278,012
- Issue date Jan 11, 1994
- Hitachi, Ltd.
- Chie Yamanaka
- G01 - MEASURING TESTING
Information Patent Grant
Pattern defects detection method and apparatus
- Patent number 4,953,224
- Issue date Aug 28, 1990
- Hitachi, Ltd.
- Toshiaki Ichinose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting pattern defects
- Patent number 4,860,371
- Issue date Aug 22, 1989
- Hitachi, Ltd.
- Yukio Matsuyama
- G06 - COMPUTING CALCULATING COUNTING