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Toshiaki Kita

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  • Hinodemachi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Capillary array
    • Patent number 8,142,635
    • Issue date Mar 27, 2012
    • Hitachi, Ltd.
    • Yasushi Shimizu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Capillary array
    • Patent number 7,785,458
    • Issue date Aug 31, 2010
    • Hitachi, Ltd.
    • Yasushi Shimizu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Capillary array unit and electrophoresis based thereon
    • Patent number 7,445,701
    • Issue date Nov 4, 2008
    • Hitachi Ltd.
    • Tomonari Morioka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Capillary array and capillary array photodetector
    • Patent number 7,054,004
    • Issue date May 30, 2006
    • Hitachi, Ltd.
    • Ryoji Inaba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Capillary array
    • Patent number 7,005,052
    • Issue date Feb 28, 2006
    • Hitachi, Ltd.
    • Yasushi Shimizu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Capillary array and electrophoresis apparatus
    • Patent number 6,977,034
    • Issue date Dec 20, 2005
    • Hitachi, Ltd.
    • Tomonari Morioka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Capillary array
    • Patent number 6,805,784
    • Issue date Oct 19, 2004
    • Hitachi, Ltd.
    • Syozo Kasai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical device diffraction gratings and a photomask for use in the...
    • Patent number 5,340,637
    • Issue date Aug 23, 1994
    • Hitachi, Ltd.
    • Makoto Okai
    • G02 - OPTICS
  • Information Patent Grant

    Monochromator
    • Patent number 5,078,495
    • Issue date Jan 7, 1992
    • Hitachi, Ltd.
    • Tatsuo Harada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Monochrometer
    • Patent number 5,047,650
    • Issue date Sep 10, 1991
    • Hitachi, Ltd.
    • Tatsuo Harada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrometer
    • Patent number 4,983,039
    • Issue date Jan 8, 1991
    • Hitachi, Ltd.
    • Tatsuo Harada
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Method of producing varied line-space diffraction gratings
    • Patent number 4,690,506
    • Issue date Sep 1, 1987
    • Hitachi, Ltd.
    • Toshiaki Kita
    • B43 - WRITING OR DRAWING IMPLEMENTS BUREAU ACCESSORIES
  • Information Patent Grant

    Concave grating spectrometer
    • Patent number 4,568,187
    • Issue date Feb 4, 1986
    • Hitachi, Ltd.
    • Toshiaki Kita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Concave gratings
    • Patent number 4,312,569
    • Issue date Jan 26, 1982
    • Hitachi, Ltd.
    • Tatsuo Harada
    • G02 - OPTICS
  • Information Patent Grant

    Diffraction grating ruling engine
    • Patent number 4,219,933
    • Issue date Sep 2, 1980
    • Hitachi, Ltd.
    • Toshiaki Kita
    • B26 - HAND CUTTING TOOLS CUTTING SEVERING

Patents Applicationslast 30 patents