Toshiaki Miyokawa

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus using scanning electron microscope
- Patent number 6,953,939
- Issue date Oct 11, 2005
- Sony Corporation
- Tetsuo Abe
- G01 - MEASURING TESTING
Information Patent Grant
System and method for electron beam irradiation
- Patent number 6,734,437
- Issue date May 11, 2004
- Jeol Ltd.
- Setsuo Norioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron gun
- Patent number 4,926,055
- Issue date May 15, 1990
- Jeol Ltd.
- Toshiaki Miyokawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Inspection device using scanning electron microscope
- Publication number 20040144928
- Publication date Jul 29, 2004
- Tetsuo Abe
- G01 - MEASURING TESTING
Information Patent Application
System and method for electron beam irradiation
- Publication number 20030178582
- Publication date Sep 25, 2003
- JEOL Ltd.
- Setsuo Norioka
- H01 - BASIC ELECTRIC ELEMENTS