Toshiaki Mugibayashi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Computer-implemented method of process analysis
- Patent number 6,769,111
- Issue date Jul 27, 2004
- Renesas Technology Corp.
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computer-implemented method of defect analysis
- Patent number 6,741,940
- Issue date May 25, 2004
- Renesas Technology Corp.
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect analysis method and process control method
- Patent number 6,473,665
- Issue date Oct 29, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment method and semiconductor device
- Patent number 6,400,038
- Issue date Jun 4, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus for foreign matter and pattern defect
- Patent number 6,344,897
- Issue date Feb 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Grant
Defect analysis method and process control method
- Patent number 6,341,241
- Issue date Jan 22, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus for foreign matter and pattern defect
- Patent number 6,295,126
- Issue date Sep 25, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Grant
Alignment method and semiconductor device
- Patent number 6,242,318
- Issue date Jun 5, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Computer-implemented method of process analysis
- Publication number 20030065411
- Publication date Apr 3, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Computer-implemented method of defect analysis
- Publication number 20030060985
- Publication date Mar 27, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect analysis method and process control method
- Publication number 20020002415
- Publication date Jan 3, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection apparatus for foreign matter and pattern defect
- Publication number 20010046044
- Publication date Nov 29, 2001
- Mitsubishi Denki Kabushki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING
Information Patent Application
Alignment method and semiconductor device
- Publication number 20010010940
- Publication date Aug 2, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Toshiaki Mugibayashi
- H01 - BASIC ELECTRIC ELEMENTS

Toshiaki Mugibayashi

Person

Patents Grantslast 30 patents

Computer-implemented method of process analysis

Computer-implemented method of defect analysis

Defect analysis method and process control method

Alignment method and semiconductor device

Inspection apparatus for foreign matter and pattern defect

Defect analysis method and process control method

Inspection apparatus for foreign matter and pattern defect

Alignment method and semiconductor device

Patents Applicationslast 30 patents

Computer-implemented method of process analysis

Computer-implemented method of defect analysis

Defect analysis method and process control method

Inspection apparatus for foreign matter and pattern defect

Alignment method and semiconductor device