Toshiaki Obata

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for analyzing a signal under test
- Patent number 8,995,510
- Issue date Mar 31, 2015
- Tektronix, Inc.
- Toshiaki Obata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Waveform signal generator with jitter or noise on a desired bit
- Patent number 8,325,867
- Issue date Dec 4, 2012
- Tektronix, Inc.
- Toshiaki Obata
- G01 - MEASURING TESTING
Information Patent Grant
Digital signal analysis program and waveform display apparatus
- Patent number 7,729,872
- Issue date Jun 1, 2010
- Tektronix, Inc.
- Toshiaki Obata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR ANALYZING A SIGNAL UNDER TEST
- Publication number 20090245339
- Publication date Oct 1, 2009
- Tektronix, Inc.
- Toshiaki OBATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Waveform Signal Generator with Jitter or Noise on a Desired Bit
- Publication number 20090086873
- Publication date Apr 2, 2009
- Tektronix, Inc.
- Toshiaki Obata
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL SIGNAL ANALYSIS PROGRAM AND WAVEFORM DISPLAY APPARATUS
- Publication number 20070223569
- Publication date Sep 27, 2007
- TEKTRONIX JAPAN, LTD.
- Toshiaki Obata
- G01 - MEASURING TESTING