Toshiaki TANIGAKI

Person

Wako-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometric electron microscope
- Patent number 11,011,344
- Issue date May 18, 2021
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holding mechanism, manufacturing method for same, and charge...
- Patent number 10,872,743
- Issue date Dec 22, 2020
- Hitachi, Ltd.
- Akira Sugawara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron microscope for magnetic field measurement and magnetic fie...
- Patent number 10,629,410
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interference electron microscope
- Patent number 8,785,851
- Issue date Jul 22, 2014
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device including a first electron biprism to split an...
- Patent number 8,772,715
- Issue date Jul 8, 2014
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ENVIRONMENTAL CELL AND ELECTRON MICROSCOPE
- Publication number 20250022678
- Publication date Jan 16, 2025
- Hitachi, Ltd
- Fumiaki ICHIHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...
- Publication number 20240429020
- Publication date Dec 26, 2024
- Hitachi, Ltd
- Akira SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER AND ELECTRON MICROSCOPE
- Publication number 20240404781
- Publication date Dec 5, 2024
- Hitachi Ltd.
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE IMAGE PROCESSING APPARATUS AND PHASE IMAGE PROCESSING METHOD
- Publication number 20240021406
- Publication date Jan 18, 2024
- Hitachi, Ltd
- Yoshio TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFERENCE SCANNING TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20230207258
- Publication date Jun 29, 2023
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETRIC ELECTRON MICROSCOPE
- Publication number 20200273657
- Publication date Aug 27, 2020
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...
- Publication number 20190295817
- Publication date Sep 26, 2019
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDING MECHANISM, MANUFACTURING METHOD FOR SAME, AND CHARGE...
- Publication number 20190027338
- Publication date Jan 24, 2019
- Hitachi, Ltd
- Akira SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFERENCE ELECTRON MICROSCOPE
- Publication number 20130313432
- Publication date Nov 28, 2013
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM DEVICE
- Publication number 20130284925
- Publication date Oct 31, 2013
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS

Toshiaki TANIGAKI

Person

Patents Grantslast 30 patents

Interferometric electron microscope

Sample holding mechanism, manufacturing method for same, and charge...

Electron microscope for magnetic field measurement and magnetic fie...

Interference electron microscope

Electron beam device including a first electron biprism to split an...

Patents Applicationslast 30 patents

ENVIRONMENTAL CELL AND ELECTRON MICROSCOPE

SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...

SAMPLE HOLDER AND ELECTRON MICROSCOPE

PHASE IMAGE PROCESSING APPARATUS AND PHASE IMAGE PROCESSING METHOD

INTERFERENCE SCANNING TRANSMISSION ELECTRON MICROSCOPE

INTERFEROMETRIC ELECTRON MICROSCOPE

ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...

SAMPLE HOLDING MECHANISM, MANUFACTURING METHOD FOR SAME, AND CHARGE...

INTERFERENCE ELECTRON MICROSCOPE

ELECTRON BEAM DEVICE