Toshiaki Umeshima

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and connection checking method for semiconduct...
- Patent number 9,502,385
- Issue date Nov 22, 2016
- Renesas Electronics Corporation
- Naoto Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and connection checking method for semiconduct...
- Patent number 9,041,185
- Issue date May 26, 2015
- Renesas Electronics Corporation
- Naoto Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and connection checking method for semiconduct...
- Patent number 8,421,206
- Issue date Apr 16, 2013
- Renesas Electronics Corporation
- Naoto Akiyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND CONNECTION CHECKING METHOD FOR SEMICONDUCT...
- Publication number 20150221618
- Publication date Aug 6, 2015
- RENESAS ELECTRONICS CORPORATION
- Naoto AKIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND CONNECTION CHECKING METHOD FOR SEMICONDUCT...
- Publication number 20130099381
- Publication date Apr 25, 2013
- RENESAS ELECTRONICS CORPORATION
- Naoto AKIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and connection checking method for semiconduct...
- Publication number 20100127384
- Publication date May 27, 2010
- NEC LEECTRONICS CORPORATION
- Naoto Akiyama
- H01 - BASIC ELECTRIC ELEMENTS