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Toshifumi HONDA
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Patents Grants
last 30 patents
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
12,196,673
Issue date
Jan 14, 2025
HITACHI HIGH-TECH CORPORATION
Takeru Utsugi
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection device
Patent number
12,146,840
Issue date
Nov 19, 2024
HITACHI HIGH-TECH CORPORATION
Eiji Arima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection device and defect inspection method
Patent number
12,044,627
Issue date
Jul 23, 2024
HITACHI HIGH-TECH CORPORATION
Masaya Yamamoto
G02 - OPTICS
Information
Patent Grant
Defect inspection device and inspection method, and optical module
Patent number
12,025,569
Issue date
Jul 2, 2024
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Defect classification device, inspection device, and inspection system
Patent number
11,442,024
Issue date
Sep 13, 2022
Hitachi High-Technologies Corporation
Takanori Kondo
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and inspection method thereof
Patent number
11,346,791
Issue date
May 31, 2022
HITACHI HIGH-TECH CORPORATION
Masami Makuuchi
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection device
Patent number
11,143,600
Issue date
Oct 12, 2021
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
11,143,598
Issue date
Oct 12, 2021
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Inspection information generation device, inspection information ge...
Patent number
11,041,815
Issue date
Jun 22, 2021
HITACHI HIGH-TECH CORPORATION
Takahiro Urano
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and pattern chip
Patent number
10,955,361
Issue date
Mar 23, 2021
HITACHI HIGH-TECH CORPORATION
Yuta Urano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection device, pattern chip, and defect inspection method
Patent number
10,948,424
Issue date
Mar 16, 2021
HITACHI HIGH-TECH CORPORATION
Yuta Urano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection device and defect inspection method
Patent number
10,861,145
Issue date
Dec 8, 2020
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
10,830,706
Issue date
Nov 10, 2020
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Flaw inspection device and flaw inspection method
Patent number
10,816,484
Issue date
Oct 27, 2020
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Defect detection device and defect observation device
Patent number
10,642,164
Issue date
May 5, 2020
Hitachi High-Technologies Corporation
Yuko Otani
G01 - MEASURING TESTING
Information
Patent Grant
Flaw inspection device and flaw inspection method
Patent number
10,466,181
Issue date
Nov 5, 2019
Hitachi High-Technologies Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Defect observation method and device and defect detection device
Patent number
10,401,300
Issue date
Sep 3, 2019
Hitachi High-Technologies Corporation
Yuko Otani
G02 - OPTICS
Information
Patent Grant
Defect inspection method, low light detecting method, and low light...
Patent number
10,261,026
Issue date
Apr 16, 2019
Hitachi High-Technologies Corporation
Yuta Urano
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection device and defect inspection method
Patent number
10,228,332
Issue date
Mar 12, 2019
Hitachi High-Technologies Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and its device
Patent number
9,976,966
Issue date
May 22, 2018
Hitachi High-Technologies Corporation
Yukihiro Shibata
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and defect inspection device
Patent number
9,865,046
Issue date
Jan 9, 2018
Hitachi High-Technologies Corporation
Takahiro Urano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection device and defect inspection method
Patent number
9,778,206
Issue date
Oct 3, 2017
Hitachi High-Technologies Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for observing defects
Patent number
9,773,641
Issue date
Sep 26, 2017
Hitachi High-Technologies Corporation
Yuko Otani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for reviewing a defect and apparatus
Patent number
9,733,194
Issue date
Aug 15, 2017
Hitachi High-Technologies Corporation
Yuko Otani
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for detecting defects and method and device for o...
Patent number
9,683,946
Issue date
Jun 20, 2017
Hitachi High-Technologies Corporation
Yuko Otani
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspecting defects
Patent number
9,678,021
Issue date
Jun 13, 2017
Hitachi High-Technologies Corporation
Yuta Urano
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection device and defect inspection method
Patent number
9,645,094
Issue date
May 9, 2017
Hitachi High-Technologies Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and device using same
Patent number
9,606,071
Issue date
Mar 28, 2017
Hitachi High-Technologies Corporation
Yukihiro Shibata
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Defect inspection method, low light detecting method and low light...
Patent number
9,588,054
Issue date
Mar 7, 2017
Hitachi High-Technologies Corporation
Yuta Urano
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
9,588,055
Issue date
Mar 7, 2017
Hitachi High-Technologies Corporation
Yuta Urano
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SURFACE INSPECTION APPARATUS
Publication number
20250012732
Publication date
Jan 9, 2025
HITACHI HIGH-TECH CORPORATION
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE
Publication number
20240280483
Publication date
Aug 22, 2024
Hitachi High-Tech Corporation
Takeru UTSUGI
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
Publication number
20240230551
Publication date
Jul 11, 2024
HITACHI HIGH-TECH CORPORATION
Yuta URANO
G01 - MEASURING TESTING
Information
Patent Application
SURFACE INSPECTION DEVICE AND SHAPE MEASUREMENT SOFTWARE
Publication number
20240159520
Publication date
May 16, 2024
Hitachi High-Tech Corporation
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
Publication number
20240133824
Publication date
Apr 25, 2024
HITACHI HIGH-TECH CORPORATION
Yuta URANO
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE
Publication number
20240096667
Publication date
Mar 21, 2024
Hitachi High-Tech Corporation
Hiromichi YAMAKAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION APPARATUS
Publication number
20230175982
Publication date
Jun 8, 2023
HITACHI HIGH-TECH CORPORATION
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20230175978
Publication date
Jun 8, 2023
Hitachi High-Tech Corporation
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
Defect Inspection Apparatus and Defect Inspection Method
Publication number
20230175979
Publication date
Jun 8, 2023
Hitachi High-Tech Corporation
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE
Publication number
20230160835
Publication date
May 25, 2023
HITACHI HIGH-TECH CORPORATION
Eiji ARIMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20230060883
Publication date
Mar 2, 2023
HITACHI HIGH-TECH CORPORATION
Takeru UTSUGI
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20220357285
Publication date
Nov 10, 2022
Hitachi High-Tech Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Application
Defect Inspection Device and Defect Inspection Method
Publication number
20220317058
Publication date
Oct 6, 2022
Hitachi High-Tech Corporation
Masaya YAMAMOTO
G02 - OPTICS
Information
Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
Publication number
20220291140
Publication date
Sep 15, 2022
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE AND INSPECTION METHOD, AND OPTICAL MODULE
Publication number
20220074868
Publication date
Mar 10, 2022
Hitachi High-Tech Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20210025829
Publication date
Jan 28, 2021
HITACHI HIGH-TECH CORPORATION
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE AND INSPECTION METHOD THEREOF
Publication number
20200393388
Publication date
Dec 17, 2020
Hitachi High-Tech Corporation
Masami Makuuchi
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE
Publication number
20200371047
Publication date
Nov 26, 2020
Hitachi High-Tech Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20200256804
Publication date
Aug 13, 2020
Hitachi High-Technologies Corporation
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
Defect Classification Device, Inspection Device, and Inspection System
Publication number
20200256807
Publication date
Aug 13, 2020
Hitachi High-Technologies Corporation
Takanori KONDO
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND PATTERN CHIP
Publication number
20200182804
Publication date
Jun 11, 2020
Hitachi High-Technologies Corporation
Yuta URANO
G01 - MEASURING TESTING
Information
Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
Publication number
20200057003
Publication date
Feb 20, 2020
Hitachi High-Technologies Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
Publication number
20190206047
Publication date
Jul 4, 2019
Hitachi High-Technologies Corporation
Toshifumi HONDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION INFORMATION GENERATION DEVICE, INSPECTION INFORMATION GE...
Publication number
20190154593
Publication date
May 23, 2019
Hitachi High-Technologies Corporation
Takahiro URANO
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION DEVICE, PATTERN CHIP, AND DEFECT INSPECTION METHOD
Publication number
20190107498
Publication date
Apr 11, 2019
Hitachi High-Technologies Corporation
Yuta URANO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
Publication number
20190094155
Publication date
Mar 28, 2019
Hitachi High-Technologies Corporation
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE
Publication number
20180088469
Publication date
Mar 29, 2018
Hitachi High-Technologies Corporation
Yuko OTANI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Defect Inspection Device and Defect Inspection Method
Publication number
20170146463
Publication date
May 25, 2017
Hitachi High-Technologies Corporation
Toshifumi HONDA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD, AND LOW LIGHT...
Publication number
20170115231
Publication date
Apr 27, 2017
Hitachi High-Technologies Corporation
Yuta Urano
G01 - MEASURING TESTING
Information
Patent Application
DEFECT OBSERVATION METHOD AND DEVICE AND DEFECT DETECTION DEVICE
Publication number
20170108444
Publication date
Apr 20, 2017
Hitachi High-Technologies Corporation
Yuko OTANI
G02 - OPTICS