Toshifumi Ishii

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Hadano, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testable LSI device incorporating latch/shift registers and method...
- Patent number 4,912,395
- Issue date Mar 27, 1990
- Hitachi, Ltd.
- Yoshio Sato
- G11 - INFORMATION STORAGE
Information Patent Grant
Diagnosing method for logic circuits
- Patent number 4,743,840
- Issue date May 10, 1988
- Hitachi Computer Engineering Co., Ltd.
- Yoshio Sato
- G01 - MEASURING TESTING