Toshiharu Kasahara

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Okegawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measuring method by spectrum analyzer
- Patent number 6,229,316
- Issue date May 8, 2001
- Advantest Corporation
- Takayoshi Fukui
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method by spectrum analyzer
- Patent number 6,191,571
- Issue date Feb 20, 2001
- Advantest Corporation
- Takayoshi Fukui
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring frequency response function
- Patent number 4,885,708
- Issue date Dec 5, 1989
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Distortion measuring system method utilizing signal suppression
- Patent number 4,774,454
- Issue date Sep 27, 1988
- Advantest Corporation
- Takahiro Yamaguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Burst signal generator
- Patent number 4,713,788
- Issue date Dec 15, 1987
- Takeda Riken Kogyo Kabushikikaisha
- Toshiharu Kasahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for measurement by digital spectrum analyzer
- Patent number 4,607,216
- Issue date Aug 19, 1986
- Takeda Riken Kogyo Kubushikikaisha
- Takahiro Yamaguchi
- G01 - MEASURING TESTING