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Toshiharu Miyata
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic encoder
Patent number
6,646,434
Issue date
Nov 11, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Linear scale measuring device and position detection method using t...
Patent number
6,642,509
Issue date
Nov 4, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Position measuring device and error detecting method for the same,...
Patent number
6,636,035
Issue date
Oct 21, 2003
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Grant
Relative-displacement detecting unit and relative-displacement dete...
Patent number
6,597,167
Issue date
Jul 22, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Electro magnetic induction position detector using metal foil to re...
Patent number
6,545,461
Issue date
Apr 8, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Induced current position sensor having a closed magnetic path
Patent number
6,531,866
Issue date
Mar 11, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Induction type transducer and electronic caliper
Patent number
6,522,129
Issue date
Feb 18, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Linear scale measuring device and position detection method using t...
Patent number
6,521,885
Issue date
Feb 18, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Relative-displacement detecting unit
Patent number
6,486,796
Issue date
Nov 26, 2002
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Grant
Induction-type position measuring apparatus
Patent number
6,259,249
Issue date
Jul 10, 2001
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Linear scale measuring device and position detection method using t...
Publication number
20030089844
Publication date
May 15, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Magnetic encoder
Publication number
20030080733
Publication date
May 1, 2003
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Position measuring device and error detecting method for the same,...
Publication number
20020030484
Publication date
Mar 14, 2002
Mitutoyo Corporation
Tetsuro Kiriyama
G01 - MEASURING TESTING
Information
Patent Application
Induction type transducer and electronic caliper
Publication number
20020011838
Publication date
Jan 31, 2002
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Relative-displacement detecting unit and relative-displacement dete...
Publication number
20020011839
Publication date
Jan 31, 2002
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Induced current position transducer
Publication number
20020008510
Publication date
Jan 24, 2002
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Relative-displacement detecting unit
Publication number
20020005726
Publication date
Jan 17, 2002
Toshiharu Miyata
G01 - MEASURING TESTING
Information
Patent Application
Induction-type position measuring apparatus
Publication number
20010020846
Publication date
Sep 13, 2001
Mitutoyo Corporation
Toshiharu Miyata
G01 - MEASURING TESTING