TOSHIHARU NISHIYAMA

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Hiroshima, JP

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Patents Applicationslast 30 patents

Information Patent Application
ALIGNMENT-OVERLAY MARK AND METHOD USING THE SAME
- Publication number 20240096813
- Publication date Mar 21, 2024
- Micron Technology, Inc.
- KAZUKO YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES AND METHODS FOR DIFFRACTION BASE OVERLAY MEASUREMENTS
- Publication number 20230194996
- Publication date Jun 22, 2023
- Micron Technology, Inc.
- KAZUKO TSUCHIYA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY