Toshiharu Saitoh

Person

South Burlington, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
LSSD-compatible edge-triggered shift register latch
- Patent number 7,543,203
- Issue date Jun 2, 2009
- International Business Machines Corporation
- Gerry Ashton
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing embedded DRAM arrays
- Patent number 7,237,165
- Issue date Jun 26, 2007
- International Business Machines Corporation
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing and repair methodology for memories having redundancy
- Patent number 7,222,274
- Issue date May 22, 2007
- International Business Machines Corporation
- Michael L. Combs
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing embedded DRAM arrays
- Patent number 7,073,100
- Issue date Jul 4, 2006
- International Business Machines Corporation
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-timed and self-tested fuse blow
- Patent number 6,819,160
- Issue date Nov 16, 2004
- International Business Machines Corporation
- Toshiharu Saitoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Reduced-pin integrated circuit I/O test
- Patent number 6,397,361
- Issue date May 28, 2002
- International Business Machines Corporation
- Toshiharu Saitoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Low power LSSD flip flops and a flushable single clock splitter for...
- Patent number 6,304,122
- Issue date Oct 16, 2001
- International Business Machines Corporation
- Roger P. Gregor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for testing the data output system of a memory...
- Patent number 5,826,006
- Issue date Oct 20, 1998
- International Business Machines Corporation
- Toshiharu Saitoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing the address system of a memory system
- Patent number 5,689,514
- Issue date Nov 18, 1997
- International Business Machines Corporation
- Toshiharu Saitoh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
LSSD-COMPATIBLE EDGE-TRIGGERED SHIFT REGISTER LATCH
- Publication number 20050204244
- Publication date Sep 15, 2005
- International Business Machines Corporation
- Gerry Ashton
- G01 - MEASURING TESTING
Information Patent Application
TESTING AND REPAIR METHODOLOGY FOR MEMORIES HAVING REDUNDANCY
- Publication number 20050188287
- Publication date Aug 25, 2005
- International Business Machines Corporation
- Michael L. Combs
- G01 - MEASURING TESTING
Information Patent Application
Method for testing embedded DRAM arrays
- Publication number 20050088888
- Publication date Apr 28, 2005
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Application
Self-timed and self-tested fuse blow
- Publication number 20040090261
- Publication date May 13, 2004
- International Business Machines Corporation
- Toshiharu Saitoh
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing embedded DRAM arrays
- Publication number 20040093539
- Publication date May 13, 2004
- International Business Machines Corporation
- Laura S. Chadwick
- G11 - INFORMATION STORAGE

Toshiharu Saitoh

Person

Patents Grantslast 30 patents

LSSD-compatible edge-triggered shift register latch

Method for testing embedded DRAM arrays

Testing and repair methodology for memories having redundancy

Method for testing embedded DRAM arrays

Self-timed and self-tested fuse blow

Reduced-pin integrated circuit I/O test

Low power LSSD flip flops and a flushable single clock splitter for...

Method and apparatus for testing the data output system of a memory...

Method and apparatus for testing the address system of a memory system

Patents Applicationslast 30 patents

LSSD-COMPATIBLE EDGE-TRIGGERED SHIFT REGISTER LATCH

TESTING AND REPAIR METHODOLOGY FOR MEMORIES HAVING REDUNDANCY

Method for testing embedded DRAM arrays

Self-timed and self-tested fuse blow

Method for testing embedded DRAM arrays