Toshiharu Sugiura

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Tokoname-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for configuration examination
- Patent number 7,593,099
- Issue date Sep 22, 2009
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor crystal for generating terahertz waves, terahertz wav...
- Patent number 7,177,071
- Issue date Feb 13, 2007
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR CONFIGURATION EXAMINATION
- Publication number 20080084554
- Publication date Apr 10, 2008
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor crystal for generating terahertz waves, terahertz wav...
- Publication number 20050258368
- Publication date Nov 24, 2005
- AISIN SEIKI KABUSHIKI KAISHA
- Hideyuki Ohtake
- G02 - OPTICS