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Toshihide Dohi
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Minoo, JP
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last 30 patents
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Patent Grant
Interferometer for measuring a surface configuration of a test obje...
Patent number
5,387,975
Issue date
Feb 7, 1995
Minolta Co., Ltd.
Futoshi Ishida
G01 - MEASURING TESTING
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Patent Grant
Projection exposure apparatus
Patent number
5,323,208
Issue date
Jun 21, 1994
Hitachi, Ltd.
Hiroshi Fukuda
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY