TREA

Toshihide HANAWA

Follow

Person

  • Tokyo, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Analysis method of automatic analyzer
    • Patent number 11,860,177
    • Issue date Jan 2, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Shibuya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer, automatic analysis system, and display method o...
    • Patent number 11,740,253
    • Issue date Aug 29, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Hirofumi Sasaki
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automated analysis system
    • Patent number 11,340,243
    • Issue date May 24, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Shibuya
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Automated analysis system
    • Patent number 11,262,372
    • Issue date Mar 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Shibuya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,073,525
    • Issue date Jul 27, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yasuo Kaneko
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,746,755
    • Issue date Aug 18, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi Shibuya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer, remote maintenance system, and maintenance method
    • Patent number 10,692,600
    • Issue date Jun 23, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Kentaro Suzuki
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Automatic analysis device
    • Patent number 10,234,472
    • Issue date Mar 19, 2019
    • Hitachi High-Technologies Corporation
    • Hirofumi Sasaki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Automated Analysis System
    • Publication number 20210123935
    • Publication date Apr 29, 2021
    • Hitachi High-Technologies Corporation
    • Satoshi SHIBUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANALYSIS METHOD OF AUTOMATIC ANALYSER
    • Publication number 20200333367
    • Publication date Oct 22, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Satoshi SHIBUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS SYSTEM
    • Publication number 20200049724
    • Publication date Feb 13, 2020
    • Hitachi High-Technologies Corporation
    • Satoshi SHIBUYA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER, AUTOMATIC ANALYSIS SYSTEM, AND DISPLAY METHOD O...
    • Publication number 20190227090
    • Publication date Jul 25, 2019
    • Hitachi High-Technologies Corporation
    • Hirofumi SASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER, REMOTE MAINTENANCE SYSTEM, AND MAINTENANCE METHOD
    • Publication number 20190206559
    • Publication date Jul 4, 2019
    • Kentaro SUZUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190079107
    • Publication date Mar 14, 2019
    • Hitachi High-Technologies Corporation
    • Yasuo KANEKO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSER
    • Publication number 20180217173
    • Publication date Aug 2, 2018
    • Hitachi High-Technologies Corporation
    • Satoshi SHIBUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20170212137
    • Publication date Jul 27, 2017
    • Hitachi High-Technologies Corporation
    • Hirofumi SASAKI
    • G01 - MEASURING TESTING