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Toshihide ORIHASHI

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,962,558
    • Issue date Mar 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,732,192
    • Issue date Aug 4, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Satoru Chida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,094,844
    • Issue date Oct 9, 2018
    • Hitachi High-Technologies Corporation
    • Yoshiaki Saito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 9,945,881
    • Issue date Apr 17, 2018
    • Hitachi High-Technologies Corporation
    • Yoshiaki Saito
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer and method for washing sample-pipetting probe
    • Patent number 9,897,519
    • Issue date Feb 20, 2018
    • Hitachi High-Technologies Corporation
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,891,240
    • Issue date Feb 13, 2018
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,797,827
    • Issue date Oct 24, 2017
    • Hitachi High-Technologies Corporation
    • Toshihide Orihashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 9,618,526
    • Issue date Apr 11, 2017
    • Hitachi High-Technologies Corporation
    • Yoshiaki Saito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzing device, information display method thereof, and...
    • Patent number 9,389,238
    • Issue date Jul 12, 2016
    • Hitachi High-Technologies Corporation
    • Tatsuya Tokunaga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,341,638
    • Issue date May 17, 2016
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer and maintenance method for same
    • Patent number 9,316,662
    • Issue date Apr 19, 2016
    • Hitachi High-Technologies Corporation
    • Ryohei Ishigami
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,164,112
    • Issue date Oct 20, 2015
    • Hitachi High-Technologies Corporation
    • Toshihide Orihashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,600,689
    • Issue date Dec 3, 2013
    • Hitachi High-Technologies Corporation
    • Toshihide Orihashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,580,196
    • Issue date Nov 12, 2013
    • Hitachi High-Technologies Corporation
    • Yasunao Awata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,343,423
    • Issue date Jan 1, 2013
    • Hitachi High-Technologies Corporation
    • Hiroki Mori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Graphical user interface for a computer display
    • Patent number D652839
    • Issue date Jan 24, 2012
    • Hitachi High-Technologies Corporation
    • Tatsuya Tokunaga
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Computer display with graphical user interface
    • Patent number D633514
    • Issue date Mar 1, 2011
    • Hitachi High-Technologies Corporation
    • Tatsuya Tokunaga
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Graphical user interface for a computer display
    • Patent number D630645
    • Issue date Jan 11, 2011
    • Hitachi High-Technologies Corporation
    • Tatsuya Tokunaga
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Graphical user interface for a computer display
    • Patent number D630648
    • Issue date Jan 11, 2011
    • Hitachi High-Technologies Corporation
    • Tatsuya Tokunaga
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Graphical user interface for a computer display
    • Patent number D630649
    • Issue date Jan 11, 2011
    • Hitachi High-Technologies Corporation
    • Tatsuya Tokunaga
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Automatic analyzing system
    • Patent number 7,556,771
    • Issue date Jul 7, 2009
    • Hitachi High-Technologies Corporation
    • Kazuhiro Nakamura
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE
    • Publication number 20180156702
    • Publication date Jun 7, 2018
    • Hitachi High-Technologies Corporation
    • Naoto SUZUKI
    • Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180128847
    • Publication date May 10, 2018
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170153261
    • Publication date Jun 1, 2017
    • Hitachi High-Technologies Corporation
    • Satoru CHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20160341753
    • Publication date Nov 24, 2016
    • Hitachi High-Technologies Corporation
    • Yoshiaki SAITO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150377771
    • Publication date Dec 31, 2015
    • Hitachi High-Technologies Corporation
    • Toshihide Orihashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150204895
    • Publication date Jul 23, 2015
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20150153370
    • Publication date Jun 4, 2015
    • Hitachi High-Technologies Corporation
    • Yoshiaki Saito
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE
    • Publication number 20140363896
    • Publication date Dec 11, 2014
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER AND MAINTENANCE METHOD FOR SAME
    • Publication number 20140202828
    • Publication date Jul 24, 2014
    • Hitachi High-Technologies Corporation
    • Ryohei Ishigami
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140170023
    • Publication date Jun 19, 2014
    • Hitachi High-Technologies Corporation
    • Yoshiaki Saito
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140147335
    • Publication date May 29, 2014
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING DEVICE, INFORMATION DISPLAY METHOD THEREOF, AND...
    • Publication number 20130009988
    • Publication date Jan 10, 2013
    • Hitachi High-Technologies Corporation
    • Tatsuya Tokunaga
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110169836
    • Publication date Jul 14, 2011
    • Hitachi High-Technologies Corporation
    • Toshihide Orihashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20090214385
    • Publication date Aug 27, 2009
    • Hiroki MORI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20080056939
    • Publication date Mar 6, 2008
    • Yasunao AWATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatc analyzer
    • Publication number 20070072299
    • Publication date Mar 29, 2007
    • Toshihide Orihashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzing system
    • Publication number 20040091396
    • Publication date May 13, 2004
    • Kazuhiro Nakamura
    • G01 - MEASURING TESTING