Toshihiko Aoki

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scale and manufacturing method of the same
- Patent number 11,747,173
- Issue date Sep 5, 2023
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Scale and manufacturing method of the same
- Patent number 11,307,058
- Issue date Apr 19, 2022
- Mitutoyo Corporation
- Toshihiko Aoki
- G02 - OPTICS
Information Patent Grant
Scale and manufacturing method of the same
- Patent number 11,054,286
- Issue date Jul 6, 2021
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Scale of photoelectric encoder including base member having roughen...
- Patent number 9,258,007
- Issue date Feb 9, 2016
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Inductive displacement detector and micrometer
- Patent number 7,081,746
- Issue date Jul 25, 2006
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Light spot position sensor and displacement measuring device
- Patent number 6,838,688
- Issue date Jan 4, 2005
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric encoder having improved light-emitting and photorecep...
- Patent number 6,794,638
- Issue date Sep 21, 2004
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Optical displacement-measuring apparatus
- Patent number 6,791,699
- Issue date Sep 14, 2004
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Light receiving array, method of manufacturing the array, and optic...
- Patent number 6,759,725
- Issue date Jul 6, 2004
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder and method of fabricating its sensor head
- Patent number 6,621,068
- Issue date Sep 16, 2003
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measuring apparatus
- Patent number 6,512,222
- Issue date Jan 28, 2003
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING TOOL ATTACHMENT COVER
- Publication number 20230075939
- Publication date Mar 9, 2023
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
SCALE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20220268601
- Publication date Aug 25, 2022
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
SCALE
- Publication number 20220082411
- Publication date Mar 17, 2022
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
SCALE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20210247547
- Publication date Aug 12, 2021
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
SCALE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20190204119
- Publication date Jul 4, 2019
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
SCALE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20190204118
- Publication date Jul 4, 2019
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
SCALE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20190186957
- Publication date Jun 20, 2019
- Mitutoyo Corporation
- Toshihiko Aoki
- G02 - OPTICS
Information Patent Application
SCALE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20190170911
- Publication date Jun 6, 2019
- Mitutoyo Corporation
- Toshihiko Aoki
- G02 - OPTICS
Information Patent Application
SCALE OF PHOTOELECTRIC ENCODER AND MANUFACTURING METHOD OF THE SAME
- Publication number 20130127644
- Publication date May 23, 2013
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING MACHINE AND PROBE THEREOF
- Publication number 20090056157
- Publication date Mar 5, 2009
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Inductive displacement detector and micrometer
- Publication number 20050122197
- Publication date Jun 9, 2005
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Light receiving array, method of manufacturing the array, and optic...
- Publication number 20030164531
- Publication date Sep 4, 2003
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Photoelectric encoder
- Publication number 20030048536
- Publication date Mar 13, 2003
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Light spot position sensor and displacement measuring device
- Publication number 20020021450
- Publication date Feb 21, 2002
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Optical displacement-measuring apparatus
- Publication number 20020018220
- Publication date Feb 14, 2002
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Optical encoder and method of fabricating its sensor head
- Publication number 20020008195
- Publication date Jan 24, 2002
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Light receiving array, method of manufacturing the array, and optic...
- Publication number 20010054712
- Publication date Dec 27, 2001
- Mitutoyo Corporation
- Toshihiko Aoki
- G01 - MEASURING TESTING
Information Patent Application
Displacement measuring apparatus
- Publication number 20010011699
- Publication date Aug 9, 2001
- Displacement Measuring Apparatus
- Toshihiko Aoki
- G01 - MEASURING TESTING

Toshihiko Aoki

Person

Patents Grantslast 30 patents

Scale and manufacturing method of the same

Scale and manufacturing method of the same

Scale and manufacturing method of the same

Scale of photoelectric encoder including base member having roughen...

Inductive displacement detector and micrometer

Light spot position sensor and displacement measuring device

Photoelectric encoder having improved light-emitting and photorecep...

Optical displacement-measuring apparatus

Light receiving array, method of manufacturing the array, and optic...

Optical encoder and method of fabricating its sensor head

Displacement measuring apparatus

Patents Applicationslast 30 patents

MEASURING TOOL ATTACHMENT COVER

SCALE AND MANUFACTURING METHOD OF THE SAME

SCALE

SCALE AND MANUFACTURING METHOD OF THE SAME

SCALE AND MANUFACTURING METHOD OF THE SAME

SCALE AND MANUFACTURING METHOD OF THE SAME

SCALE AND MANUFACTURING METHOD OF THE SAME

SCALE AND MANUFACTURING METHOD OF THE SAME

SCALE OF PHOTOELECTRIC ENCODER AND MANUFACTURING METHOD OF THE SAME

SHAPE MEASURING MACHINE AND PROBE THEREOF

Inductive displacement detector and micrometer

Light receiving array, method of manufacturing the array, and optic...

Photoelectric encoder

Light spot position sensor and displacement measuring device

Optical displacement-measuring apparatus

Optical encoder and method of fabricating its sensor head

Light receiving array, method of manufacturing the array, and optic...

Displacement measuring apparatus