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Toshihiko Nakamura
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Chiba, JP
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last 30 patents
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Patent Grant
Viscoelasticity measuring apparatus
Patent number
8,978,479
Issue date
Mar 17, 2015
Hitachi High-Tech Science Corporation
Nobuaki Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Freezing point temperature measuring method and temperature calibra...
Patent number
7,547,137
Issue date
Jun 16, 2009
Sii Nano Technology Inc.
Toshihiko Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Thermal analyzer with gas mixing chamber
Patent number
7,104,680
Issue date
Sep 12, 2006
SII NanoTechnology Inc.
Toshihiko Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Automatic humidity step control thermal analysis apparatus
Patent number
6,616,330
Issue date
Sep 9, 2003
Seiko Instruments Inc.
Nobutaka Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic viscoelasticity measuring system
Patent number
6,386,045
Issue date
May 14, 2002
Seiko Instruments Inc.
Toshihiko Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Thermogravimetric instrument
Patent number
6,057,516
Issue date
May 2, 2000
Seiko Instruments, Inc.
Toshihiko Nakamura
G01 - MEASURING TESTING