Toshihiko Ogura

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Tsukuba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Image forming method and impedance microscope
- Patent number 11,454,605
- Issue date Sep 27, 2022
- Toshihiko Ogura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dielectric constant microscope and method of observing organic spec...
- Patent number 10,634,635
- Issue date Apr 28, 2020
- Toshihiko Ogura
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Thin Film Damage Detection Function and Charged Particle Beam Device
- Publication number 20240085352
- Publication date Mar 14, 2024
- Hitachi High-Tech Corporation
- Michio HATANO
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder, Intermembrane Distance Adjustment Mechanism, and Cha...
- Publication number 20240079201
- Publication date Mar 7, 2024
- Hitachi High-Tech Corporation
- Michio HATANO
- H01 - BASIC ELECTRIC ELEMENTS