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Toshihiko SAKASHITA

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  • Osaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device
    • Patent number 8,669,555
    • Issue date Mar 11, 2014
    • Panasonic Corporation
    • Masao Takahashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 8,338,829
    • Issue date Dec 25, 2012
    • Panasonic Corporation
    • Masao Takahashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 7,999,256
    • Issue date Aug 16, 2011
    • Panasonic Corporation
    • Masao Takahashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device having a probing region
    • Patent number 7,944,059
    • Issue date May 17, 2011
    • Panasonic Corporation
    • Noriyuki Nagai
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor wafer and testing method therefor
    • Patent number 7,170,189
    • Issue date Jan 30, 2007
    • Matsushita Electric Industrial Co., Ltd.
    • Masao Takahashi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20130075727
    • Publication date Mar 28, 2013
    • PANASONIC CORPORATION
    • Masao TAKAHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20110266540
    • Publication date Nov 3, 2011
    • PANASONIC CORPORATION
    • Masao TAKAHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20110215481
    • Publication date Sep 8, 2011
    • Panasonic Corporation
    • Noriyuki Nagai
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20090078935
    • Publication date Mar 26, 2009
    • Masao Takahashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device
    • Publication number 20070052085
    • Publication date Mar 8, 2007
    • Matsushita Electric Industrial Co., Ltd.
    • Noriyuki Nagai
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor wafer and testing method therefor
    • Publication number 20060103408
    • Publication date May 18, 2006
    • Matsushita Electric Industrial Co., Ltd.
    • Masao Takahashi
    • G01 - MEASURING TESTING