Toshihiko Yamauchi

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting foreign particle
- Patent number 4,965,454
- Issue date Oct 23, 1990
- Hitachi, Ltd.
- Toshihiko Yamauchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY