Toshihiko YOSHIKAWA

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Miyoshi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface profile inspection device
- Patent number 8,451,878
- Issue date May 28, 2013
- Aisin Seiki Kabushiki Kaisha
- Masaru Hisanaga
- G01 - MEASURING TESTING
Information Patent Grant
Concave-convex surface inspection apparatus
- Patent number 8,049,868
- Issue date Nov 1, 2011
- Aisin Seiki Kabushiki Kaisha
- Masataka Toda
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning apparatus
- Patent number 6,246,502
- Issue date Jun 12, 2001
- Aisin Seiki Kabushiki Kaisha
- Tohru Okada
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SURFACE PROFILE INSPECTION DEVICE
- Publication number 20120147919
- Publication date Jun 14, 2012
- AISIN SEIKI KABUSHIKI KAISHA
- Masaru HISANAGA
- G01 - MEASURING TESTING
Information Patent Application
CONCAVE-CONVEX SURFACE INSPECTION APPARATUS
- Publication number 20090231570
- Publication date Sep 17, 2009
- AISIN SEIKI KABUSHIKI KAISHA,
- Masataka Toda
- G01 - MEASURING TESTING