Toshihiro Fujii

Person

Hamura-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for ion attachment mass spectrometry
- Patent number 7,015,461
- Issue date Mar 21, 2006
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization apparatus
- Patent number 7,005,634
- Issue date Feb 28, 2006
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion attachment mass spectrometry
- Patent number 6,800,848
- Issue date Oct 5, 2004
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion attachment mass spectrometry apparatus, ionization apparatus, a...
- Patent number 6,768,108
- Issue date Jul 27, 2004
- Anelva Corporation
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus
- Patent number 6,635,868
- Issue date Oct 21, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization method for mass spectrometry and mass spectrometry appar...
- Patent number 6,590,205
- Issue date Jul 8, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization apparatus and ionization method for mass spectrometry
- Patent number 6,559,443
- Issue date May 6, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Halide compound mass spectrometry method and mass spectrometry appa...
- Patent number 6,507,020
- Issue date Jan 14, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source for ion attachment mass spectrometry apparatus
- Patent number 6,479,814
- Issue date Nov 12, 2002
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SIGNAL SYNCHRONIZATION CIRCUIT, SIGNAL PROCESSING DEVICE, SIGNAL SY...
- Publication number 20250056150
- Publication date Feb 13, 2025
- TDK Corporation
- Toshihiro FUJII
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Ion attachment mass spectrometry apparatus, ionization apparatus, a...
- Publication number 20040011955
- Publication date Jan 22, 2004
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization apparatus
- Publication number 20020139930
- Publication date Oct 3, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for ion attachment mass spectrometry
- Publication number 20020084408
- Publication date Jul 4, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization apparatus and ionization method for mass spectrometry
- Publication number 20020053636
- Publication date May 9, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometry apparatus
- Publication number 20020036263
- Publication date Mar 28, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization method for mass spectrometry and mass spectrometry appar...
- Publication number 20020020813
- Publication date Feb 21, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for ion attachment mass spectrometry
- Publication number 20010048074
- Publication date Dec 6, 2001
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion source for ion attachment mass spectrometry apparatus
- Publication number 20010023922
- Publication date Sep 27, 2001
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Halide compound mass spectrometry method and mass spectrometry appa...
- Publication number 20010004102
- Publication date Jun 21, 2001
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS

Toshihiro Fujii

Person

Patents Grantslast 30 patents

Method and apparatus for ion attachment mass spectrometry

Ionization apparatus

Method and apparatus for ion attachment mass spectrometry

Ion attachment mass spectrometry apparatus, ionization apparatus, a...

Mass spectrometry apparatus

Ionization method for mass spectrometry and mass spectrometry appar...

Ionization apparatus and ionization method for mass spectrometry

Halide compound mass spectrometry method and mass spectrometry appa...

Ion source for ion attachment mass spectrometry apparatus

Patents Applicationslast 30 patents

SIGNAL SYNCHRONIZATION CIRCUIT, SIGNAL PROCESSING DEVICE, SIGNAL SY...

Ion attachment mass spectrometry apparatus, ionization apparatus, a...

Ionization apparatus

Method and apparatus for ion attachment mass spectrometry

Ionization apparatus and ionization method for mass spectrometry

Mass spectrometry apparatus

Ionization method for mass spectrometry and mass spectrometry appar...

Method and apparatus for ion attachment mass spectrometry

Ion source for ion attachment mass spectrometry apparatus

Halide compound mass spectrometry method and mass spectrometry appa...