Toshihiro Hiraoka

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Functional block for integrated circuit, semiconductor integrated c...
- Patent number 6,708,301
- Issue date Mar 16, 2004
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of design for testability for integrated circuits
- Patent number 6,510,535
- Issue date Jan 21, 2003
- Matsushita Electric Industrial Co., Inc.
- Toshinori Hosokawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Functional block for integrated circuit, semiconductor integrated c...
- Publication number 20040139376
- Publication date Jul 15, 2004
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of design for testability for integrated circuits
- Publication number 20030009716
- Publication date Jan 9, 2003
- Toshinori Hosokawa
- G01 - MEASURING TESTING