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Toshihiro Ikeyama
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Kyoto-shi, JP
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last 30 patents
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Patent Grant
Quadrupole mass spectrometer, quadrupole mass spectrometry method,...
Patent number
11,270,878
Issue date
Mar 8, 2022
Horiba Stec, Co., Ltd.
Kohei Sasai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Element analysis device and element analysis method
Patent number
10,978,285
Issue date
Apr 13, 2021
Horiba, Ltd.
Takahito Inoue
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermionic emission filament, quadrupole mass spectrometer and resi...
Patent number
10,026,582
Issue date
Jul 17, 2018
Horiba Stec, Co., Ltd.
Kohei Sasai
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
QUADRUPOLE MASS SPECTROMETER, QUADRUPOLE MASS SPECTROMETRY METHOD,...
Publication number
20210166932
Publication date
Jun 3, 2021
Horiba Stec, Co., Ltd.
Kohei SASAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELEMENT ANALYSIS DEVICE AND ELEMENT ANALYSIS METHOD
Publication number
20190206667
Publication date
Jul 4, 2019
HORIBA, LTD.
Takahito INOUE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THERMIONIC EMISSION FILAMENT, QUADRUPOLE MASS SPECTROMETER AND RESI...
Publication number
20170169981
Publication date
Jun 15, 2017
Horiba Stec, Co., Ltd.
Kohei SASAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CAPACITANCE TYPE MEASURING DEVICE
Publication number
20130162270
Publication date
Jun 27, 2013
HORIBA STEC, CO., LTD.
Soutaro Kishida
G01 - MEASURING TESTING