Toshihiro Ishizuka

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe
- Patent number 7,868,635
- Issue date Jan 11, 2011
- Fujitsu Limited
- Toshihiro Ishizuka
- G01 - MEASURING TESTING
Information Patent Grant
Probe and method of manufacturing a probe
- Patent number 7,612,572
- Issue date Nov 3, 2009
- Fujitsu Limited
- Toshihiro Ishizuka
- G01 - MEASURING TESTING
Information Patent Grant
Strobo electron beam apparatus
- Patent number 4,755,749
- Issue date Jul 5, 1988
- Fujitsu Limited
- Kazuo Ookubo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POLISHING APPARATUS
- Publication number 20100105297
- Publication date Apr 29, 2010
- Fujitsu Limited
- Toshihiro Ishizuka
- B24 - GRINDING POLISHING
Information Patent Application
SOCKET FOR DOUBLE ENDED PROBE, DOUBLE ENDED PROBE, AND PROBE UNIT
- Publication number 20100007365
- Publication date Jan 14, 2010
- Fujitsu Limited
- Toshihiro Ishizuka
- G01 - MEASURING TESTING
Information Patent Application
Probe, probe card, and testing device
- Publication number 20080157797
- Publication date Jul 3, 2008
- Fujitsu Limited
- Toshihiro Ishizuka
- G01 - MEASURING TESTING
Information Patent Application
Probe, probe card, and testing device
- Publication number 20070229097
- Publication date Oct 4, 2007
- FUJITSU LIMITED
- Toshihiro Ishizuka
- G01 - MEASURING TESTING
Information Patent Application
Probe and method of manufacturing a probe
- Publication number 20070200582
- Publication date Aug 30, 2007
- FUJITSU LIMITED
- Toshihiro Ishizuka
- G01 - MEASURING TESTING