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Toshihiro Kubota
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Miki-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Automatic sample analyzer and its components
Patent number
6,772,650
Issue date
Aug 10, 2004
Sysmex Corporation
Yasuhiro Ohyama
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Automatic sample analyzer and its components
Publication number
20060029520
Publication date
Feb 9, 2006
Eiji Tanoshima
G01 - MEASURING TESTING
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Patent Application
Automatic sample analyzer and its components
Publication number
20030070498
Publication date
Apr 17, 2003
Yasuhiro Ohyama
G01 - MEASURING TESTING