Toshihiro NISHIDA

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Nasushiobara-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Signal processing circuit, physical quantity detection apparatus, a...
- Patent number 9,046,366
- Issue date Jun 2, 2015
- Seiko Epson Corporation
- Yoshinao Yanagisawa
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit, physical quantity detection apparatus, angular v...
- Patent number 8,850,887
- Issue date Oct 7, 2014
- Seiko Epson Corporation
- Yoshinao Yanagisawa
- G01 - MEASURING TESTING
Information Patent Grant
Angular velocity detection apparatus
- Patent number 8,618,890
- Issue date Dec 31, 2013
- Seiko Epson Corporation
- Yoshinao Yanagisawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DRIVER CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, ANGULAR VELO...
- Publication number 20130057354
- Publication date Mar 7, 2013
- SEIKO NPC CORPORATION
- Yoshinao YANAGISAWA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, ANGULAR V...
- Publication number 20130055810
- Publication date Mar 7, 2013
- SEIKO NPC CORPORATION
- Yoshinao YANAGISAWA
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING CIRCUIT, PHYSICAL QUANTITY DETECTION APPARATUS, A...
- Publication number 20130055815
- Publication date Mar 7, 2013
- SEIKO NPC CORPORATION
- Yoshinao YANAGISAWA
- G01 - MEASURING TESTING