Toshihiro UENO

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope
- Patent number 10,712,363
- Issue date Jul 14, 2020
- Hitachi High-Tech Science Corporation
- Masayuki Iwasa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope and optical axis adjustment method for sc...
- Patent number 10,466,271
- Issue date Nov 5, 2019
- Hitachi High-Tech Science Corporation
- Masafumi Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190234992
- Publication date Aug 1, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masayuki IWASA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD FOR SC...
- Publication number 20170059609
- Publication date Mar 2, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masafumi WATANABE
- G01 - MEASURING TESTING