Toshihisa SONE

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and measurement device
- Patent number 11,854,952
- Issue date Dec 26, 2023
- Lapis Semiconductor Co., Ltd.
- Toshihisa Sone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having an oscillator and an associated integra...
- Patent number 11,309,234
- Issue date Apr 19, 2022
- Lapis Semiconductor Co., Ltd.
- Toshihisa Sone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and measurement device
- Patent number 10,622,944
- Issue date Apr 14, 2020
- Lapis Semiconductor Co., Ltd.
- Kengo Takemasa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device and measurement device
- Patent number 10,615,108
- Issue date Apr 7, 2020
- Lapis Semiconductor Co., Ltd.
- Toshihisa Sone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, measurement device, and correction method
- Patent number 10,411,715
- Issue date Sep 10, 2019
- Lapis Semiconductor Co., Ltd.
- Kazuya Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and measurement device
- Patent number 10,243,515
- Issue date Mar 26, 2019
- Lapis Semiconductor Co., Ltd.
- Kengo Takemasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with oscillation frequency error correction
- Patent number 9,838,022
- Issue date Dec 5, 2017
- Lapis Semiconductor Co., Ltd.
- Kazuya Yamada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device and measurement device
- Patent number 9,787,250
- Issue date Oct 10, 2017
- Lapis Semiconductor Co., Ltd.
- Kengo Takemasa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Correcting temperature based oscillation frequency errors in semico...
- Patent number 9,584,134
- Issue date Feb 28, 2017
- Lapis Semiconductor Co., Ltd.
- Kazuya Yamada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device and measurement device having an oscillator
- Patent number 9,257,377
- Issue date Feb 9, 2016
- Lapis Semiconductor Co., Ltd.
- Toshihisa Sone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and measurement device
- Patent number 9,230,890
- Issue date Jan 5, 2016
- Lapis Semiconductor Co., Ltd.
- Kengo Takemasa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device, measurement device, and correction method
- Patent number 9,197,217
- Issue date Nov 24, 2015
- Lapis Semiconductor Co., Ltd.
- Kazuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and measurement device having an oscillator
- Patent number 8,921,987
- Issue date Dec 30, 2014
- Lapis Semiconductor Co., Ltd.
- Toshihisa Sone
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE
- Publication number 20240105565
- Publication date Mar 28, 2024
- LAPIS SEMICONDUCTOR CO., LTD.
- Toshihisa SONE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE
- Publication number 20220223505
- Publication date Jul 14, 2022
- LAPIS SEMICONDUCTOR CO., LTD.
- Toshihisa SONE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE
- Publication number 20200235046
- Publication date Jul 23, 2020
- LAPIS SEMICONDUCTOR CO., LTD.
- Toshihisa SONE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE
- Publication number 20190190449
- Publication date Jun 20, 2019
- LAPIS SEMICONDUCTOR CO., LTD.
- Kengo TAKEMASA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE, MEASUREMENT DEVICE, AND CORRECTION METHOD
- Publication number 20180076817
- Publication date Mar 15, 2018
- LAPIS SEMICONDUCTOR CO., LTD.
- Kazuya YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE
- Publication number 20180006604
- Publication date Jan 4, 2018
- LAPIS SEMICONDUCTOR CO., LTD.
- Kengo TAKEMASA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, MEASUREMENT DEVICE, AND CORRECTION METHOD
- Publication number 20170126233
- Publication date May 4, 2017
- LAPIS SEMICONDUCTOR CO., LTD.
- Kazuya YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE
- Publication number 20160155690
- Publication date Jun 2, 2016
- LAPIS SEMICONDUCTOR CO., LTD.
- Toshihisa SONE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE
- Publication number 20160118938
- Publication date Apr 28, 2016
- LAPIS SEMICONDUCTOR CO., LTD.
- Kengo TAKEMASA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, MEASUREMENT DEVICE, AND CORRECTION METHOD
- Publication number 20160049944
- Publication date Feb 18, 2016
- LAPIS SEMICONDUCTOR CO., LTD.
- Kazuya YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE HAVING AN OSCILLATOR
- Publication number 20150076673
- Publication date Mar 19, 2015
- LAPIS SEMICONDUCTOR CO., LTD.
- Toshihisa SONE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE
- Publication number 20130285224
- Publication date Oct 31, 2013
- LAPIS SEMICONDUCTOR CO., LTD.
- Kengo TAKEMASA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, MEASUREMENT DEVICE, AND CORRECTION METHOD
- Publication number 20130285640
- Publication date Oct 31, 2013
- LAPIS SEMICONDUCTOR CO., LTD.
- Kazuya YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE
- Publication number 20130285225
- Publication date Oct 31, 2013
- LAPIS SEMICONDUCTOR CO., LTD.
- Toshihisa SONE
- H01 - BASIC ELECTRIC ELEMENTS

Toshihisa SONE

Person

Patents Grantslast 30 patents

Semiconductor device and measurement device

Semiconductor device having an oscillator and an associated integra...

Semiconductor device and measurement device

Semiconductor device and measurement device

Semiconductor device, measurement device, and correction method

Semiconductor device and measurement device

Semiconductor device with oscillation frequency error correction

Semiconductor device and measurement device

Correcting temperature based oscillation frequency errors in semico...

Semiconductor device and measurement device having an oscillator

Semiconductor device and measurement device

Semiconductor device, measurement device, and correction method

Semiconductor device and measurement device having an oscillator

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE

SEMICONDUCTOR DEVICE, MEASUREMENT DEVICE, AND CORRECTION METHOD

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE

SEMICONDUCTOR DEVICE, MEASUREMENT DEVICE, AND CORRECTION METHOD

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE

SEMICONDUCTOR DEVICE, MEASUREMENT DEVICE, AND CORRECTION METHOD

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE HAVING AN OSCILLATOR

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE

SEMICONDUCTOR DEVICE, MEASUREMENT DEVICE, AND CORRECTION METHOD

SEMICONDUCTOR DEVICE AND MEASUREMENT DEVICE