Toshihisa Tanaka

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray apparatus and structure production method
- Patent number 10,571,412
- Issue date Feb 25, 2020
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus and structure production method
- Patent number 10,533,958
- Issue date Jan 14, 2020
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus and structure production method
- Patent number 10,502,699
- Issue date Dec 10, 2019
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray apparatus
- Patent number 10,145,806
- Issue date Dec 4, 2018
- Nikon Corporation
- Toshihisa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Blur compensation device, lens barrel, and camera device
- Patent number 9,529,209
- Issue date Dec 27, 2016
- Nikon Corporation
- Kenta Nakamura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Linear motor and lens unit
- Patent number 8,873,172
- Issue date Oct 28, 2014
- Nikon Corporation
- Toshihisa Tanaka
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Polishing apparatus with dressing position setting means
- Patent number 8,412,370
- Issue date Apr 2, 2013
- Nikon Corporation
- Toshihisa Tanaka
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing pad surface shape measuring instrument, method of using p...
- Patent number 7,486,407
- Issue date Feb 3, 2009
- Nikon Corporation
- Toshihisa Tanaka
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing pad surface shape measuring instrument, method of using p...
- Patent number 7,359,069
- Issue date Apr 15, 2008
- Nikon Corporation
- Toshihisa Tanaka
- B24 - GRINDING POLISHING
Information Patent Grant
Focus control device to perform focus control for a multi-layer rec...
- Patent number 6,101,156
- Issue date Aug 8, 2000
- Nikon Corporation
- Toshihisa Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Focus control device to perform focus control for a multi-layer rec...
- Patent number 5,978,328
- Issue date Nov 2, 1999
- Nikon Corporation
- Toshihisa Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Information recording and reproduction device
- Patent number 5,936,924
- Issue date Aug 10, 1999
- Nikon Corporation
- Toshihisa Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field applying device
- Patent number 5,856,957
- Issue date Jan 5, 1999
- Nikon Corporation
- Toshihisa Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Recording medium having first tracks and second tracks at different...
- Patent number 5,831,964
- Issue date Nov 3, 1998
- Nikon Corporation
- Toshihisa Tanaka
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
X-RAY APPARATUS AND STRUCTURE PRODUCTION METHOD
- Publication number 20170219499
- Publication date Aug 3, 2017
- Nikon Corporation
- Toshihisa TANAKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS
- Publication number 20160377558
- Publication date Dec 29, 2016
- Nikon Corporation
- Toshihisa TANAKA
- G01 - MEASURING TESTING
Information Patent Application
BLUR COMPENSATION DEVICE, LENS BARREL, AND CAMERA DEVICE
- Publication number 20140313583
- Publication date Oct 23, 2014
- Kenta NAKAMURA
- G02 - OPTICS
Information Patent Application
LENS UNIT AND IMAGE CAPTURING APPARATUS
- Publication number 20140049849
- Publication date Feb 20, 2014
- Nikon Corporation
- Hosei NAKAHIRA
- G02 - OPTICS
Information Patent Application
POLISHING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE E...
- Publication number 20130183886
- Publication date Jul 18, 2013
- Nikon Corporation
- Toshihisa TANAKA
- B24 - GRINDING POLISHING
Information Patent Application
LENS UNIT AND IMAGE CAPTURING APPARATUS
- Publication number 20120194929
- Publication date Aug 2, 2012
- Nikon Corporation
- Hosei NAKAHIRA
- G02 - OPTICS
Information Patent Application
LINEAR MOTOR AND LENS UNIT
- Publication number 20120087022
- Publication date Apr 12, 2012
- Nikon Corporation
- Toshihisa TANAKA
- G02 - OPTICS
Information Patent Application
Polishing Apparatus, Method of Manufacturing Semiconductor Device E...
- Publication number 20100035520
- Publication date Feb 11, 2010
- Toshihisa Tanaka
- B24 - GRINDING POLISHING
Information Patent Application
Polishing pad surface shape measuring instrument, method of using p...
- Publication number 20080186511
- Publication date Aug 7, 2008
- NIKON CORPORATION
- Toshihisa Tanaka
- B24 - GRINDING POLISHING
Information Patent Application
Polishing pad surface shape measuring instrument, method of using p...
- Publication number 20060260745
- Publication date Nov 23, 2006
- NIKON CORPORATION
- Toshihisa Tanaka
- B24 - GRINDING POLISHING

Toshihisa Tanaka

Person

Patents Grantslast 30 patents

X-ray apparatus and structure production method

X-ray apparatus and structure production method

X-ray apparatus and structure production method

X-ray apparatus

Blur compensation device, lens barrel, and camera device

Linear motor and lens unit

Polishing apparatus with dressing position setting means

Polishing pad surface shape measuring instrument, method of using p...

Polishing pad surface shape measuring instrument, method of using p...

Focus control device to perform focus control for a multi-layer rec...

Focus control device to perform focus control for a multi-layer rec...

Information recording and reproduction device

Magnetic field applying device

Recording medium having first tracks and second tracks at different...

Patents Applicationslast 30 patents

X-RAY APPARATUS AND STRUCTURE PRODUCTION METHOD

X-RAY APPARATUS

BLUR COMPENSATION DEVICE, LENS BARREL, AND CAMERA DEVICE

LENS UNIT AND IMAGE CAPTURING APPARATUS

POLISHING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE E...

LENS UNIT AND IMAGE CAPTURING APPARATUS

LINEAR MOTOR AND LENS UNIT

Polishing Apparatus, Method of Manufacturing Semiconductor Device E...

Polishing pad surface shape measuring instrument, method of using p...

Polishing pad surface shape measuring instrument, method of using p...