Toshikatsu Kaneyama

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and control method of charged parti...
- Patent number 11,640,894
- Issue date May 2, 2023
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 7,977,630
- Issue date Jul 12, 2011
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analysis using energy loss spectrometer and transmission...
- Patent number 7,459,680
- Issue date Dec 2, 2008
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus having electron analyzer and method of cont...
- Patent number 7,030,389
- Issue date Apr 18, 2006
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope equipped with energy filter
- Patent number 6,720,558
- Issue date Apr 13, 2004
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope equipped with energy filter
- Patent number 6,586,737
- Issue date Jul 1, 2003
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holography transmission electron microscope
- Patent number 6,573,501
- Issue date Jun 3, 2003
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam energy filter
- Patent number 6,483,110
- Issue date Nov 19, 2002
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging energy filter equipped with distortion corrector
- Patent number 6,140,642
- Issue date Oct 31, 2000
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter
- Patent number 5,952,656
- Issue date Sep 14, 1999
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen-driving apparatus for electron microscope which tilts and...
- Patent number 5,264,705
- Issue date Nov 23, 1993
- Jeol Ltd.
- Toshikazu Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for correcting axial coma in electron microscopy
- Patent number 5,258,617
- Issue date Nov 2, 1993
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus and Control Method of Charged Parti...
- Publication number 20200168431
- Publication date May 28, 2020
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope and Measurement Method
- Publication number 20190228948
- Publication date Jul 25, 2019
- JEOL Ltd.
- Noriaki Mizuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of analysis using energy loss spectrometer and transmission...
- Publication number 20060255271
- Publication date Nov 16, 2006
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope
- Publication number 20050242284
- Publication date Nov 3, 2005
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus having electron analyzer and method of cont...
- Publication number 20040188608
- Publication date Sep 30, 2004
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission electron microscope equipped with energy filter
- Publication number 20020153484
- Publication date Oct 24, 2002
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Holography transmission electron microscope
- Publication number 20010042830
- Publication date Nov 22, 2001
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission electron microscope equipped with energy filter
- Publication number 20010010358
- Publication date Aug 2, 2001
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS

Toshikatsu Kaneyama

Person

Patents Grantslast 30 patents

Charged particle beam apparatus and control method of charged parti...

Electron microscope

Method of analysis using energy loss spectrometer and transmission...

Electron beam apparatus having electron analyzer and method of cont...

Transmission electron microscope equipped with energy filter

Transmission electron microscope equipped with energy filter

Holography transmission electron microscope

Electron beam energy filter

Imaging energy filter equipped with distortion corrector

Energy filter

Specimen-driving apparatus for electron microscope which tilts and...

Method and apparatus for correcting axial coma in electron microscopy

Patents Applicationslast 30 patents

Charged Particle Beam Apparatus and Control Method of Charged Parti...

Scanning Electron Microscope and Measurement Method

Method of analysis using energy loss spectrometer and transmission...

Electron microscope

Electron beam apparatus having electron analyzer and method of cont...

Transmission electron microscope equipped with energy filter

Holography transmission electron microscope

Transmission electron microscope equipped with energy filter