Toshikazu Honda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Energy filter
- Patent number 6,624,412
- Issue date Sep 23, 2003
- Jeol Ltd.
- Michiyoshi Tanaka
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Energy filter and electron microscope using same
- Patent number 6,407,384
- Issue date Jun 18, 2002
- Jeol Ltd.
- Michiyoshi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging energy filter equipped with distortion corrector
- Patent number 6,140,642
- Issue date Oct 31, 2000
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-beam biprism
- Patent number 5,811,806
- Issue date Sep 22, 1998
- Jeol Ltd.
- Toshikazu Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope equipped with x-ray analyzer
- Patent number 5,317,154
- Issue date May 31, 1994
- Joel Ltd.
- Toshikazu Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen-driving apparatus for electron microscope which tilts and...
- Patent number 5,264,705
- Issue date Nov 23, 1993
- Jeol Ltd.
- Toshikazu Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for correcting axial coma in electron microscopy
- Patent number 5,258,617
- Issue date Nov 2, 1993
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 4,520,264
- Issue date May 28, 1985
- Jeol Ltd.
- Katsushige Tsuno
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Energy filter
- Publication number 20020017614
- Publication date Feb 14, 2002
- Michiyoshi Tanaka
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Toshikazu Honda

Person

Patents Grantslast 30 patents

Energy filter

Energy filter and electron microscope using same

Imaging energy filter equipped with distortion corrector

Electron-beam biprism

Electron microscope equipped with x-ray analyzer

Specimen-driving apparatus for electron microscope which tilts and...

Method and apparatus for correcting axial coma in electron microscopy

Electron microscope

Patents Applicationslast 30 patents

Energy filter