TREA

Toshikazu Kikuchi

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  • Hitachi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray diffraction instrument
    • Patent number 8,923,480
    • Issue date Dec 30, 2014
    • Hitachi, Ltd.
    • Yun Wang
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    X-Ray Diffraction Instrument
    • Publication number 20130044864
    • Publication date Feb 21, 2013
    • Hitachi, Ltd
    • Yun Wang
    • G01 - MEASURING TESTING