Toshikazu Kitajima

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface voltmeter
- Patent number 7,795,886
- Issue date Sep 14, 2010
- Dainippon Screen Mgf. Co., Ltd.
- Motohiro Kono
- G01 - MEASURING TESTING
Information Patent Grant
Insulator film characteristic measuring method and insulator film c...
- Patent number 7,488,610
- Issue date Feb 10, 2009
- Dainippon Screen Mfg. Co., Ltd.
- Toshikazu Kitajima
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thickness of thin film formed on...
- Patent number 7,427,520
- Issue date Sep 23, 2008
- Dainippon Screen Mfg. Co., Ltd.
- Motohiro Kono
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring relative dielectric constant
- Patent number 7,375,537
- Issue date May 20, 2008
- Dainippon Screen Mfg. Co., Ltd.
- Toshikazu Kitajima
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measuring method, relative dielectric constant measu...
- Patent number 6,915,232
- Issue date Jul 5, 2005
- Dainippon Screen Mfg. Co., Ltd.
- Toshikazu Kitajima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for removing organic contamination adsorbed on...
- Publication number 20090019722
- Publication date Jan 22, 2009
- Dainippon Screen Mfg. Co., Ltd.
- Yoshiyuki Nakazawa
- B08 - CLEANING
Information Patent Application
Surface voltmeter
- Publication number 20080238434
- Publication date Oct 2, 2008
- Dainippon Screen Mfg. Co., Ltd.
- Motohiro Kono
- G01 - MEASURING TESTING
Information Patent Application
Insulator film characteristic measuring method and insulator film c...
- Publication number 20070148795
- Publication date Jun 28, 2007
- Dainippon Screen Mfg. Co., Ltd.
- Toshikazu Kitajima
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring relative dielectric constant
- Publication number 20050239224
- Publication date Oct 27, 2005
- Dainippon Screen Mfg. Co., Ltd.
- Toshikazu Kitajima
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring thickness of thin film formed on...
- Publication number 20050206911
- Publication date Sep 22, 2005
- Dainippon Screen Mfg. Co., Ltd.
- Motohiro Kono
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for removing organic contamination adsorbed on...
- Publication number 20050198857
- Publication date Sep 15, 2005
- Dainippon Screen Mfg. Co., Ltd.
- Yoshiyuki Nakazawa
- B08 - CLEANING
Information Patent Application
Film thickness measuring method, relative dielectric constant measu...
- Publication number 20040019442
- Publication date Jan 29, 2004
- Dainippon Screen Mfg. Co., Ltd.
- Toshikazu Kitajima
- G01 - MEASURING TESTING

Toshikazu Kitajima

Person

Patents Grantslast 30 patents

Surface voltmeter

Insulator film characteristic measuring method and insulator film c...

Method and apparatus for measuring thickness of thin film formed on...

Method and apparatus for measuring relative dielectric constant

Film thickness measuring method, relative dielectric constant measu...

Patents Applicationslast 30 patents

Apparatus and method for removing organic contamination adsorbed on...

Surface voltmeter

Insulator film characteristic measuring method and insulator film c...

Method and apparatus for measuring relative dielectric constant

Method and apparatus for measuring thickness of thin film formed on...

Apparatus and method for removing organic contamination adsorbed on...

Film thickness measuring method, relative dielectric constant measu...