Toshikazu MUKAI

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Terahertz element and semiconductor device
- Patent number 12,278,423
- Issue date Apr 15, 2025
- Rohm Co., Ltd.
- Toshikazu Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz device and production method for terahertz device
- Patent number 11,894,494
- Issue date Feb 6, 2024
- Rohm Co., Ltd.
- Kazuisao Tsuruda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz element and semiconductor device
- Patent number 11,699,846
- Issue date Jul 11, 2023
- Rohm Co., Ltd.
- Toshikazu Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz element and semiconductor device
- Patent number 11,239,547
- Issue date Feb 1, 2022
- Rohm Co., Ltd.
- Toshikazu Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz-wave detector and terahertz unit
- Patent number 11,156,550
- Issue date Oct 26, 2021
- Rohm Co., Ltd.
- Jaeyoung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz device
- Patent number 10,957,598
- Issue date Mar 23, 2021
- Rohm Co., Ltd.
- Toshikazu Mukai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflective detection device
- Patent number 10,656,021
- Issue date May 19, 2020
- Rohm Co., Ltd.
- Hideyuki Kawakami
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz device and terahertz integrated circuit
- Patent number 10,276,919
- Issue date Apr 30, 2019
- Rohm Co., Ltd.
- Sebastian Diebold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz device and fabrication method of the same
- Patent number 10,205,242
- Issue date Feb 12, 2019
- Rohm Co., Ltd.
- Toshikazu Mukai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Terahertz device module
- Patent number 10,066,984
- Issue date Sep 4, 2018
- Rohm Co., Ltd.
- Toshikazu Mukai
- G01 - MEASURING TESTING
Information Patent Grant
Solution testing equipment
- Patent number 9,431,960
- Issue date Aug 30, 2016
- Rohm Co., Ltd.
- Toshikazu Mukai
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz oscillation device
- Patent number 7,898,348
- Issue date Mar 1, 2011
- Rohm Co., Ltd.
- Toshikazu Mukai
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
TERAHERTZ ELEMENT AND SEMICONDUCTOR DEVICE
- Publication number 20250210854
- Publication date Jun 26, 2025
- ROHM CO., LTD.
- Toshikazu MUKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTODIODE
- Publication number 20250098360
- Publication date Mar 20, 2025
- Rohm Co., Ltd.
- Toshikazu MUKAI
Information Patent Application
TERAHERTZ ELEMENT AND SEMICONDUCTOR DEVICE
- Publication number 20230378640
- Publication date Nov 23, 2023
- ROHM CO., LTD.
- Toshikazu MUKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT RECEIVING ELEMENT ARRAY AND MANUFACTURING METHOD THEREFOR
- Publication number 20230369365
- Publication date Nov 16, 2023
- Rohm Co., Ltd.
- Toshikazu MUKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ ELEMENT AND SEMICONDUCTOR DEVICE
- Publication number 20220109233
- Publication date Apr 7, 2022
- ROHM CO., LTD.
- Toshikazu MUKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ DEVICE AND PRODUCTION METHOD FOR TERAHERTZ DEVICE
- Publication number 20210167254
- Publication date Jun 3, 2021
- Rohm Co., Ltd.
- Kazuisao TSURUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ DEVICE
- Publication number 20200279776
- Publication date Sep 3, 2020
- Rohm Co., Ltd.
- Toshikazu MUKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ-WAVE DETECTOR AND TERAHERTZ UNIT
- Publication number 20200200677
- Publication date Jun 25, 2020
- Rohm Co., Ltd.
- Jaeyoung KIM
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TERAHERTZ ELEMENT AND SEMICONDUCTOR DEVICE
- Publication number 20200168985
- Publication date May 28, 2020
- Rohm Co., Ltd.
- Toshikazu MUKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ DEVICE MODULE
- Publication number 20180066981
- Publication date Mar 8, 2018
- Rohm Co., Ltd.
- Toshikazu MUKAI
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE DETECTION DEVICE
- Publication number 20180003564
- Publication date Jan 4, 2018
- Rohm Co., Ltd.
- Hideyuki KAWAKAMI
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ DEVICE AND FABRICATION METHOD OF THE SAME
- Publication number 20170271774
- Publication date Sep 21, 2017
- Rohm Co., Ltd.
- Toshikazu MUKAI
- G02 - OPTICS
Information Patent Application
TERAHERTZ DEVICE AND TERAHERTZ INTEGRATED CIRCUIT
- Publication number 20170250458
- Publication date Aug 31, 2017
- Rohm Co., Ltd.
- Sebastian DIEBOLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLUTION TESTING EQUIPMENT
- Publication number 20140139238
- Publication date May 22, 2014
- KYOTO UNIVERSITY
- Toshikazu MUKAI
- G01 - MEASURING TESTING
Information Patent Application
Terahertz oscillation device
- Publication number 20100026401
- Publication date Feb 4, 2010
- ROHM CO., LTD.
- Toshikazu Mukai
- H03 - BASIC ELECTRONIC CIRCUITRY

Toshikazu MUKAI

Person

Patents Grantslast 30 patents

Terahertz element and semiconductor device

Terahertz device and production method for terahertz device

Terahertz element and semiconductor device

Terahertz element and semiconductor device

Terahertz-wave detector and terahertz unit

Terahertz device

Reflective detection device

Terahertz device and terahertz integrated circuit

Terahertz device and fabrication method of the same

Terahertz device module

Solution testing equipment

Terahertz oscillation device

Patents Applicationslast 30 patents

TERAHERTZ ELEMENT AND SEMICONDUCTOR DEVICE

PHOTODIODE

TERAHERTZ ELEMENT AND SEMICONDUCTOR DEVICE

LIGHT RECEIVING ELEMENT ARRAY AND MANUFACTURING METHOD THEREFOR

TERAHERTZ ELEMENT AND SEMICONDUCTOR DEVICE

TERAHERTZ DEVICE AND PRODUCTION METHOD FOR TERAHERTZ DEVICE

TERAHERTZ DEVICE

TERAHERTZ-WAVE DETECTOR AND TERAHERTZ UNIT

TERAHERTZ ELEMENT AND SEMICONDUCTOR DEVICE

TERAHERTZ DEVICE MODULE

REFLECTIVE DETECTION DEVICE

TERAHERTZ DEVICE AND FABRICATION METHOD OF THE SAME

TERAHERTZ DEVICE AND TERAHERTZ INTEGRATED CIRCUIT

SOLUTION TESTING EQUIPMENT

Terahertz oscillation device