Toshikazu Ohnishi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Gas analyzing apparatus
- Patent number 9,013,703
- Issue date Apr 21, 2015
- Horiba, Ltd.
- Toshikazu Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Gas analysis apparatus
- Patent number 8,934,101
- Issue date Jan 13, 2015
- Horiba, Ltd.
- Takuya Ido
- G01 - MEASURING TESTING
Information Patent Grant
Probe for gas analysis
- Patent number 8,649,013
- Issue date Feb 11, 2014
- Horiba, Ltd.
- Shigeyuki Hokamura
- G01 - MEASURING TESTING
Information Patent Grant
Air-driven shutter device and optical analyzer
- Patent number 8,531,669
- Issue date Sep 10, 2013
- Horiba, Ltd.
- Shigeyuki Hokamura
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method for manufacturing an electron-emitting device with first and...
- Patent number 7,758,762
- Issue date Jul 20, 2010
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source, and image-forming apparatus
- Patent number 7,705,527
- Issue date Apr 27, 2010
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting devices provided with a deposit between electroco...
- Patent number 7,348,719
- Issue date Mar 25, 2008
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for manufacturing image displaying apparatus
- Patent number 7,326,097
- Issue date Feb 5, 2008
- Canon Kabushiki Kaisha
- Ichiro Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing an electric emitting device with first and...
- Patent number 7,234,985
- Issue date Jun 26, 2007
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source and image-forming apparat...
- Patent number 7,057,336
- Issue date Jun 6, 2006
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source, and image-forming apparatus
- Patent number 6,908,356
- Issue date Jun 21, 2005
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source, and image forming apparatus
- Patent number 6,890,231
- Issue date May 10, 2005
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for manufacturing image displaying apparatus
- Patent number 6,848,961
- Issue date Feb 1, 2005
- Canon Kabushiki Kaisha
- Ichiro Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source, and manufacture method f...
- Patent number 6,824,437
- Issue date Nov 30, 2004
- Canon Kabushiki Kaisha
- Kazuhiro Jindai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing electron emitting device
- Patent number 6,802,752
- Issue date Oct 12, 2004
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing electron-emitting device, electron source a...
- Patent number 6,780,073
- Issue date Aug 24, 2004
- Canon Kabushiki Kaisha
- Miki Tamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for producing electron-emitting device, electron source, an...
- Patent number 6,752,676
- Issue date Jun 22, 2004
- Canon Kabushiki Kaisha
- Masataka Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source and image-forming apparat...
- Patent number 6,608,437
- Issue date Aug 19, 2003
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source and manufacture method fo...
- Patent number 6,582,268
- Issue date Jun 24, 2003
- Canon Kabushiki Kaisha
- Kazuhiro Jindai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing electron-emitting device, electron source a...
- Patent number 6,419,539
- Issue date Jul 16, 2002
- Canon Kabushiki Kaisha
- Miki Tamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source, and image-forming apparatus
- Patent number 6,384,541
- Issue date May 7, 2002
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device
- Patent number 6,344,711
- Issue date Feb 5, 2002
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source and image forming apparatus as well as method of pr...
- Patent number 6,283,815
- Issue date Sep 4, 2001
- Canon Kabushiki Kaisha
- Tatsuya Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source and image-forming apparat...
- Patent number 6,246,168
- Issue date Jun 12, 2001
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for separating particles
- Patent number 6,224,732
- Issue date May 1, 2001
- Canon Kabushiki Kaisha
- Totaro Imasaka
- G01 - MEASURING TESTING
Information Patent Grant
Methods for making electron emission device and image forming appar...
- Patent number 6,213,834
- Issue date Apr 10, 2001
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing electron-emitting device electron source an...
- Patent number 6,179,678
- Issue date Jan 30, 2001
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-emitting device, electron source and image-forming apparatus
- Patent number 6,169,356
- Issue date Jan 2, 2001
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source and image forming apparatus as well as method of pr...
- Patent number 6,160,347
- Issue date Dec 12, 2000
- Canon Kabushiki Kaisha
- Tatsuya Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing electron-emitting device and image-forming...
- Patent number 6,063,453
- Issue date May 16, 2000
- Canon Kabushiki Kaisha
- Yoshinori Tomida
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
GAS ANALYSIS APPARATUS
- Publication number 20140211209
- Publication date Jul 31, 2014
- HORIBA, LTD.
- Takuya Ido
- G01 - MEASURING TESTING
Information Patent Application
MEASURING UNIT AND GAS ANALYZING APPARATUS
- Publication number 20140183380
- Publication date Jul 3, 2014
- HORIBA, LTD.
- Juichiro Ukon
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZING APPARATUS
- Publication number 20130161544
- Publication date Jun 27, 2013
- Horiba, Ltd.
- TOSHIKAZU OHNISHI
- G01 - MEASURING TESTING
Information Patent Application
AIR-DRIVEN SHUTTER DEVICE AND OPTICAL ANALYZER
- Publication number 20120033218
- Publication date Feb 9, 2012
- Horiba, Ltd.
- Shigeyuki Hokamura
- G02 - OPTICS
Information Patent Application
PROBE FOR GAS ANALYSIS
- Publication number 20120033219
- Publication date Feb 9, 2012
- Horiba, Ltd.
- Shigeyuki Hokamura
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON-EMITTING DEVICE, ELECTRON SOURCE, AND IMAGE-FORMING APPARATUS
- Publication number 20080218059
- Publication date Sep 11, 2008
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING AN ELECTRON-EMITTING DEVICE WITH FIRST AND...
- Publication number 20080045112
- Publication date Feb 21, 2008
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing an electron-emitting device with first and...
- Publication number 20070249255
- Publication date Oct 25, 2007
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample analyzer
- Publication number 20070089543
- Publication date Apr 26, 2007
- Narihiro Oku
- G01 - MEASURING TESTING
Information Patent Application
Electron-emitting device, electron source and image-forming apparat...
- Publication number 20060189243
- Publication date Aug 24, 2006
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-emitting device, electron source, and image-forming apparatus
- Publication number 20050151703
- Publication date Jul 14, 2005
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for manufacturing image displaying apparatus
- Publication number 20050009433
- Publication date Jan 13, 2005
- Canon Kabushiki Kaisha
- Ichiro Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-emitting device, electron source, and image forming apparatus
- Publication number 20040161998
- Publication date Aug 19, 2004
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-emitting device, electron source, and image-forming apparatus
- Publication number 20040082249
- Publication date Apr 29, 2004
- Canon Kabushiki Kaisha
- Toshikazu Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-emitting device, electron source and image-forming apparat...
- Publication number 20030222570
- Publication date Dec 4, 2003
- Canon Kabushiki Kaisha
- Fumio Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fluid mixing apparatus
- Publication number 20030164409
- Publication date Sep 4, 2003
- HORIBA, LTD.
- Toshikazu Ohnishi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Electron-emitting device, electron source, and manufacture method f...
- Publication number 20030104751
- Publication date Jun 5, 2003
- Canon Kabushiki Kaisha
- Kazuhiro Jindai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing electron-emitting device, electron source a...
- Publication number 20020127941
- Publication date Sep 12, 2002
- CANON KABUSHIKI KAISHA
- Miki Tamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR PRODUCING ELECTRON-EMITTING DEVICE, ELECTRON SOURCE, AN...
- Publication number 20020016124
- Publication date Feb 7, 2002
- MASATAKA YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for manufacturing image displaying apparatus
- Publication number 20010041490
- Publication date Nov 15, 2001
- Ichiro Nomura
- H01 - BASIC ELECTRIC ELEMENTS

Toshikazu Ohnishi

Person

Patents Grantslast 30 patents

Gas analyzing apparatus

Gas analysis apparatus

Probe for gas analysis

Air-driven shutter device and optical analyzer

Method for manufacturing an electron-emitting device with first and...

Electron-emitting device, electron source, and image-forming apparatus

Electron-emitting devices provided with a deposit between electroco...

Method and apparatus for manufacturing image displaying apparatus

Method for manufacturing an electric emitting device with first and...

Electron-emitting device, electron source and image-forming apparat...

Electron-emitting device, electron source, and image-forming apparatus

Electron-emitting device, electron source, and image forming apparatus

Method and apparatus for manufacturing image displaying apparatus

Electron-emitting device, electron source, and manufacture method f...

Method of manufacturing electron emitting device

Method of manufacturing electron-emitting device, electron source a...

Methods for producing electron-emitting device, electron source, an...

Electron-emitting device, electron source and image-forming apparat...

Electron-emitting device, electron source and manufacture method fo...

Method of manufacturing electron-emitting device, electron source a...

Electron-emitting device, electron source, and image-forming apparatus

Electron-emitting device

Electron source and image forming apparatus as well as method of pr...

Electron-emitting device, electron source and image-forming apparat...

Method and apparatus for separating particles

Methods for making electron emission device and image forming appar...

Method of manufacturing electron-emitting device electron source an...

Electron-emitting device, electron source and image-forming apparatus

Electron source and image forming apparatus as well as method of pr...

Method of manufacturing electron-emitting device and image-forming...

Patents Applicationslast 30 patents

GAS ANALYSIS APPARATUS

MEASURING UNIT AND GAS ANALYZING APPARATUS

GAS ANALYZING APPARATUS

AIR-DRIVEN SHUTTER DEVICE AND OPTICAL ANALYZER

PROBE FOR GAS ANALYSIS

ELECTRON-EMITTING DEVICE, ELECTRON SOURCE, AND IMAGE-FORMING APPARATUS

METHOD FOR MANUFACTURING AN ELECTRON-EMITTING DEVICE WITH FIRST AND...

Method for manufacturing an electron-emitting device with first and...

Sample analyzer

Electron-emitting device, electron source and image-forming apparat...

Electron-emitting device, electron source, and image-forming apparatus

Method and apparatus for manufacturing image displaying apparatus

Electron-emitting device, electron source, and image forming apparatus

Electron-emitting device, electron source, and image-forming apparatus

Electron-emitting device, electron source and image-forming apparat...

Fluid mixing apparatus

Electron-emitting device, electron source, and manufacture method f...

Method of manufacturing electron-emitting device, electron source a...

METHODS FOR PRODUCING ELECTRON-EMITTING DEVICE, ELECTRON SOURCE, AN...

Method and apparatus for manufacturing image displaying apparatus