Toshikazu Tsutsui

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 6,060,781
- Issue date May 9, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Kouetsu Sawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Failure analysis method and device
- Patent number 6,016,278
- Issue date Jan 18, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Toshikazu Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for analyzing a failure in a semiconductor wafer by calculat...
- Patent number 6,009,545
- Issue date Dec 28, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Toshikazu Tsutsui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Failure analyzer
- Patent number 5,905,650
- Issue date May 18, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Toshikazu Tsutsui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for analyzing a failure in a semiconductor wafer and meth...
- Patent number 5,844,850
- Issue date Dec 1, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Toshikazu Tsutsui
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device analysis system
- Publication number 20030200056
- Publication date Oct 23, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Toshikazu Tsutsui
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device inspecting method using conducting AFM
- Publication number 20030057988
- Publication date Mar 27, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hitoshi Maeda
- G01 - MEASURING TESTING