Toshiki Oono

Follow

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Centrifugal dryer, manufacturing method for semiconductor device an...
- Patent number 6,993,854
- Issue date Feb 7, 2006
- Renesas Technology Corp.
- Hirotoshi Ise
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzing method and gas analyzer for semiconductor treater
- Patent number 6,864,982
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Minoru Hanazaki
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting device for substrate to be processed and method o...
- Patent number 6,768,542
- Issue date Jul 27, 2004
- Renesas Technology Corp.
- Hirotoshi Ise
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Defect inspecting device for substrate to be processed and method o...
- Publication number 20030053046
- Publication date Mar 20, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hirotoshi Ise
- G01 - MEASURING TESTING
Information Patent Application
Centrifugal dryer, manufacturing method for semiconductor device an...
- Publication number 20030051366
- Publication date Mar 20, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hirotoshi Ise
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas analyzing method and gas analyzer for semiconductor treater
- Publication number 20030046976
- Publication date Mar 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Minoru Hanazaki
- G01 - MEASURING TESTING