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Toshiki YAMADA
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Hamamatsu-shi, Shizuoka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor sample inspection device and inspection method
Patent number
11,927,626
Issue date
Mar 12, 2024
Hamamatsu Photonics K.K.
Toshiki Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Optical difference detector and inspection device
Patent number
11,733,091
Issue date
Aug 22, 2023
Hamamatsu Photonics K.K.
Toshiki Yamada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor sample inspection device and inspection method
Patent number
11,573,251
Issue date
Feb 7, 2023
Hamamatsu Photonics K.K.
Yoshitaka Iwaki
G01 - MEASURING TESTING
Information
Patent Grant
Optical difference detector and inspection device
Patent number
11,243,113
Issue date
Feb 8, 2022
Hamamatsu Photonics K.K.
Toshiki Yamada
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CONFOCAL MICROSCOPE UNIT, CONFOCAL MICROSCOPE, AND CONTROL METHOD F...
Publication number
20240151956
Publication date
May 9, 2024
Hamamatsu Photonics K.K.
Toshiki YAMADA
G02 - OPTICS
Information
Patent Application
SEMICONDUCTOR SAMPLE INSPECTION DEVICE AND INSPECTION METHOD
Publication number
20220308108
Publication date
Sep 29, 2022
Hamamatsu Photonics K.K.
Toshiki YAMADA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DIFFERENCE DETECTOR AND INSPECTION DEVICE
Publication number
20220090959
Publication date
Mar 24, 2022
HAMAMATSU PHOTONICS K. K.
Toshiki YAMADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR SAMPLE INSPECTION DEVICE AND INSPECTION METHOD
Publication number
20210325435
Publication date
Oct 21, 2021
Hamamatsu Photonics K.K.
Yoshitaka IWAKI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DIFFERENCE DETECTOR AND INSPECTION DEVICE
Publication number
20210010856
Publication date
Jan 14, 2021
Hamamatsu Photonics K.K.
Toshiki YAMADA
G01 - MEASURING TESTING